- Tytuł:
- X-Ray Structure Perfection Diagnostics of Slightly Distorted Silicon Crystals in the Bragg Case of Diffraction
- Autorzy:
-
Khrupa, V.
Krasulya, S.
Machulin, V.
Datsenko, L.
Auleytner, J. - Powiązania:
- https://bibliotekanauki.pl/articles/1964151.pdf
- Data publikacji:
- 1997-05
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
61.66.Bi
81.40.-z - Opis:
- A new approach to structure perfection diagnostics of dislocation-free silicon crystals has been developed using the Bragg case of diffraction. The approach is being based on successive measurements of integral reflectivity and the spatial intensity distribution of reflected beam on the same diffraction planes of a real crystal by means of a single crystal diffractometer.
- Źródło:
-
Acta Physica Polonica A; 1997, 91, 5; 981-985
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł