- Tytuł:
- Strain Relaxation of ZnTe/CdTe and CdTe/ZnTe heterostructures: In Situ Study
- Autorzy:
-
Riesz, F.
Kret, S.
Karczewski, G.
Wojtowicz, T.
Kossut, J. - Powiązania:
- https://bibliotekanauki.pl/articles/1952073.pdf
- Data publikacji:
- 1996-11
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
61.14.Hg
68.55.Bd
68.65.+g - Opis:
- The strain relaxation kinetics of ZnTe/CdTe and CdTe/ZnTe heterostructures grown on GaAs substrates by molecular beam epitaxy are studied by in situ reflection high-energy electron diffraction. The observed critical layer thickness is 5 monolayers for ZnTe/CdTe and less than 1 monolayer for CdTe/ZnTe. The relaxation is anisotropic. Dislocation core parameters and relaxation rate constants were determined using a kinetic model and assuming strain-dependent activation energy of dislocation movement.
- Źródło:
-
Acta Physica Polonica A; 1996, 90, 5; 911-914
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł