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Wyszukujesz frazę "72.20.-I" wg kryterium: Temat


Wyświetlanie 1-2 z 2
Tytuł:
Electrical and Dielectric Properties of Amorphous Ge$\text{}_{1}$Se$\text{}_{1.35}$TL$\text{}_{0.1}$ Films
Autorzy:
Abdel-Aziz, M. M.
Afifi, M. A.
Labib, H. H.
El-Metwally, E. G.
Powiązania:
https://bibliotekanauki.pl/articles/2014346.pdf
Data publikacji:
2000-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
72.80.Ng
72.20.-i
Opis:
The temperature dependence of the DC and AC electrical conductivity were measured for Ge$\text{}_{1}$Se$\text{}_{1.35}$Tl$\text{}_{0.1}$ films. The value of DC electrical conduction energy ΔE$\text{}_{σ}$ does not depend on film thickness in the investigated range with mean value of 0.72eV. The AC conductivity σ$\text{}_{AC}$ is related to frequency by the expression σ$\text{}_{AC}$=Aω$\text{}^{S}$, where S is the frequency exponent which decreases linearly with increasing temperature. This can be explained in terms of the pair (bipolaron) correlated barrier hopping model suggested by Elliott. The frequency and temperature dependence of real and imaginary parts of the dielectric constant were studied for Ge$\text{}_{1}$Se$\text{}_{1.35}$Tl$\text{}_{0.1}$ films. The dielectric constant (real part) and the dielectric loss (imaginary part) increase with increasing temperature and decrease with increasing frequency in the investigated range of frequency and temperature. The maximum barrier height W$\text{}_{M}$ can be calculated according to the Giuntini equation at different temperatures. The obtained value of W$\text{}_{M}$ is in good agreement with the theory of hopping of charge carriers over a potential barrier as suggested by Elliott in case of chalcogenide glasses.
Źródło:
Acta Physica Polonica A; 2000, 98, 4; 393-399
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of Annealing on the AC Conductivity and the Dielectric Properties of In$\text{}_{2}$Te$\text{}_{3}$ Thin Films
Autorzy:
Afifi, M. A.
Abd El-Wahabb, E.
Bekheet, A. E.
Atyia, H. E.
Powiązania:
https://bibliotekanauki.pl/articles/2014347.pdf
Data publikacji:
2000-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
77.55.+f
72.20.-i
Opis:
In$\text{}_{2}$Te$\text{}_{3}$ thin films were prepared by thermal evaporation technique. The composition of the films is checked by energy dispersive X-ray analysis. X-ray analysis showed that the as-deposited In$\text{}_{2}$Te$\text{}_{3}$ films as well as films annealed at temperatures ≤473K have crystalline structure. The ac conductivity σ$\text{}_{ac}$(ω), the dielectric constant ε$\text{}_{1}$ and the dielectric loss ε$\text{}_{2}$ of In$\text{}_{2}$Te$\text{}_{3}$ films were studied in the temperature range 303-373K and in the frequency range 100Hz-100kHz. The ac conduction activation energy ΔE$\text{}_{σ}$(ω) was found to be 0.065eV for the as-deposited films. The ac conductivity was found to obey the relation σ$\text{}_{ac}$(ω)=Aω$\text{}^{s}$, where s is the frequency exponent. The obtained temperature dependence of s is reasonably interpreted by quantum mechanical tunneling model. Both the dielectric constant ε$\text{}_{1}$ and the dielectric loss ε$\text{}_{2}$ increased with temperature and decreased with frequency in the investigated range. The frequency and temperature dependencies of σ$\text{}_{ac}$(ω), ε$\text{}_{1}$, and ε$\text{}_{2}$ for the annealed samples have the same behavior as that for the as-deposited samples. However, values of σ$\text{}_{ac}$(ω), ε$\text{}_{1}$, and ε$\text{}_{2}$ measured at any frequency and temperature increased with annealing temperature up to 473K. It was found also that ΔE$\text{}_{σ}$(ω) decreased with annealing temperature.
Źródło:
Acta Physica Polonica A; 2000, 98, 4; 401-409
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-2 z 2

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