- Tytuł:
- Semi-automatic test system for characterization of ASIC/MPWS
- Autorzy:
-
Zając, J.
Wójcik, J.
Kociubiński, A.
Tomaszewski, D. - Powiązania:
- https://bibliotekanauki.pl/articles/308858.pdf
- Data publikacji:
- 2005
- Wydawca:
- Instytut Łączności - Państwowy Instytut Badawczy
- Tematy:
-
automatic testing
diagnostics of technology
multi-project wafers - Opis:
- A measurement system for integrated circuit testing has been developed. It consists of a semi-automatic probe station and a set of measurement equipment controlled by commercially available measurement software. The probe station is controlled by dedicated software. Both the measurement and station-control software communicate using the DDE protocol. The measurement system is flexible. It is particularly suitable for semi-automatic testing of multi-project wafers. Output data generated by the system is used for the characterization of the CMOS technologies.
- Źródło:
-
Journal of Telecommunications and Information Technology; 2005, 1; 124-128
1509-4553
1899-8852 - Pojawia się w:
- Journal of Telecommunications and Information Technology
- Dostawca treści:
- Biblioteka Nauki
Artykuł