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    Wyświetlanie 1-3 z 3
    Tytuł:
    Temperature-induced changes in the topography and morphology of C–nPd films deposited on fused silica
    Autorzy:
    Diduszko, R.
    Kowalska, E.
    Kozłowski, M.
    Czerwosz, E.
    Kamińska, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/174476.pdf
    Data publikacji:
    2013
    Wydawca:
    Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
    Tematy:
    carbonaceous-palladium film
    PVD
    XRD
    SEM
    FTIR
    Opis:
    Changes in superficial and structural properties in carbonaceous–palladium (C–Pd) films prepared by PVD method, induced by annealing them in an inert atmosphere were studied. C–Pd films with different Pd content in a carbon matrix were investigated. SEM observation after heat treatment showed the agglomeration of palladium nanograins into bigger grains and significant changes in a topography and morphology of C–Pd films. XRD studies confirmed the formation of big (more than 100 nm in diameter) Pd nanograins as a result of the annealing process. FTIR studies showed that C–Pd films from PVD process contained fullerene C60 and palladium acetate (films precursors), which were decomposed during the annealing process.
    Źródło:
    Optica Applicata; 2013, 43, 1; 133-141
    0078-5466
    1899-7015
    Pojawia się w:
    Optica Applicata
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    The influence of technological PVD process parameters on the topography, crystal and molecular structure of nanocomposite films containing palladium nanograins
    Autorzy:
    Rymarczyk, J.
    Czerwosz, E.
    Kozłowski, M.
    Dłużewski, P.
    Kowalski, W.
    Powiązania:
    https://bibliotekanauki.pl/articles/778619.pdf
    Data publikacji:
    2014
    Wydawca:
    Zachodniopomorski Uniwersytet Technologiczny w Szczecinie. Wydawnictwo Uczelniane ZUT w Szczecinie
    Tematy:
    palladium
    carbon
    SEM
    AFM
    TEM
    FTIR
    Opis:
    The paper describes the preparation and characteristics of films composed of Pd nanograins placed in carbonaceous matrix. Films were obtained in PVD (Physical Vapor Deposition) process from two sources containing: the first one – fullerene powder and the second one – palladium acetate. The topographical, morphological and structural changes due to different parameters of PVD process were studied with the use of Atomic Force Microscopy and Scanning Electron Microscopy, whereas the structure was studied with the application of the Transmission Electron Microscopy and Fourier Transform Infrared Spectroscopy methods. It was shown that topographical changes are connected with the decomposition ratio of Pd acetate as well as the form of carbonaceous matrix formed due to this decomposition. Palladium nanograins found in all films exhibit the fcc structure type and their diameter changes from 2 nm to 40 nm depending on the PVD process parameters.
    Źródło:
    Polish Journal of Chemical Technology; 2014, 16, 3; 18-24
    1509-8117
    1899-4741
    Pojawia się w:
    Polish Journal of Chemical Technology
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Annealing time effects on the surface morphology of C–Pd films prepared on silicon covered with SiO2
    Autorzy:
    Kozlowski, M.
    Radomska, J.
    Wronka, H.
    Czerwosz, E.
    Firek, P.
    Sobczak, K.
    Dluzewski, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/949412.pdf
    Data publikacji:
    2013
    Wydawca:
    Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
    Tematy:
    Pd
    carbon
    film
    SEM
    TEM
    Opis:
    Morphology changes of C–Pd films prepared in physical vapor deposition (PVD) process and next annealed in a temperature of 650 °C during different time were studied. These studies were performed with electron microscopy methods (scanning SEM and transmission TEM). It was found that not annealed films are flat and they are composed of grains with composite character and size of 100–200 nm. Pd nanocrystallite of a diameter of a few nanometers in some carbon matrix was placed in these grains. For annealed films, a formation of palladium nanograins with different sizes and shapes as well as a porous carbon matrix were observed. High resolution TEM investigation was used to determine a structure of all these grains. An increase in duration time of annealing process led to diminishing of the porosity of carbon matrix and a number of Pd grains situated on the film surface. It was also stated that covering of Si with SiO2 layer prevents formation of palladium silicide.
    Źródło:
    Optica Applicata; 2013, 43, 1; 81-89
    0078-5466
    1899-7015
    Pojawia się w:
    Optica Applicata
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-3 z 3

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