- Tytuł:
- Strain Relaxation in Thin Films of La$\text{}_{1.85}$Sr$\text{}_{0.15}$CuO$\text{}_{4}$ Grown by Pulsed Laser Deposition
- Autorzy:
-
Zaytseva, I.
Cieplak, M. Z.
Abal'oshev, A.
Berkowski, M.
Domukhovski, V.
Paszkowicz, W.
Shalimov, A. - Powiązania:
- https://bibliotekanauki.pl/articles/2047252.pdf
- Data publikacji:
- 2007-01
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
68.55.-a
74.62.-c
74.72.Dn
74.78.Bz
74.25.Fy - Opis:
- X-ray diffraction, resistivity, and susceptibility measurements are used to examine the effects of film thickness d (from 17 to 250 nm) on the structural and superconducting properties of La$\text{}_{1.85}$Sr$\text{}_{0.15}$CuO$\text{}_{4}$ films grown by pulsed laser deposition on SrLaAlO$\text{}_{4}$ substrates. For each d the film sgrow with a variable strain, ranging from a large compressive strain in the thinnest films to a negligible or tensile strain in thick films. Our results indicate that the tensile strain is not caused by the off-stoichiometric layer at the substrate-film interface. Instead, it may be caused by the extreme oxygen deficiency in some of the films.
- Źródło:
-
Acta Physica Polonica A; 2007, 111, 1; 185-188
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł