- Tytuł:
- Optical Characterization of MBE-Grown Cd$\text{}_{1-x}$Mn$\text{}_{x}$Te Layers by Raman Spectroscopy
- Autorzy:
-
Szuszkiewicz, W.
Dynowska, E.
Janik, E.
Karczewski, G.
Wojtowicz, T.
Kossut, J.
Jouanne, M. - Powiązania:
- https://bibliotekanauki.pl/articles/1945228.pdf
- Data publikacji:
- 1996-03
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
63.20.-e
75.50.Pp
78.30.-j - Opis:
- In this paper we discuss a possibility of an optical characterization of thin semiconductor epilayers by Raman scattering measurements. As an example zinc blende Cd$\text{}_{1-x}$Mn$\text{}_{x}$Te epilayers (0.66 ≤ x ≤ 1.0) have been grown by molecular beam epitaxy method and investigated by Raman scattering and X-ray diffraction. Information resulting from both methods is compared and discussed.
- Źródło:
-
Acta Physica Polonica A; 1996, 89, 3; 335-340
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł