Temat: p16 - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Nanostructuring and Hardness Investigations of Thin Films by Scanning Force Microscopy
Autorzy:: Nowicki, M.
Richter, A.
Ries, R.
Oszwałdowski, M.
Powiązania:: https://bibliotekanauki.pl/articles/1968828.pdf
Data publikacji:: 1998-02
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.16.Ch
68.35.-p
Opis:: The scanning force microscope was used to scratch thin films and to write nanoscale pattern on surfaces as well as to perform nanoindentation for hardness measurements. Different thin film materials such as C$\text{}_{60}$ films, diamond-like carbon, metals and semiconducting films have been investigated.
Źródło:: Acta Physica Polonica A; 1998, 93, 2; 437-441
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: Lattice Parameter Relaxation during MBE of ZnTe/Cd$\text{}_{1-x}$Zn$\text{}_{x}$Te/Cd$\text{}_{0.5}$Zn$\text{}_{0.5}$Te Buffer Layers by RHLED and HRTEM
Autorzy:: Kret, S.
Karczewski, G.
Zakrzewski, A.
Dłużewski, P.
Dubon, A.
Wojtowicz, T.
Kossut, J.
Delamarre, C.
Laval, J. Y.
Powiązania:: https://bibliotekanauki.pl/articles/1933838.pdf
Data publikacji:: 1995-10
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.16.Bg
61.14.Hg
68.35.-p
Opis:: The dynamics of the lattice relaxation processes were investigated using a reflection of a high energy electron diffraction analysis system during growth by molecular beam epitaxy of ZnTe/Cd$\text{}_{1-x}$Ζn$\text{}_{x}$Te/Cd$\text{}_{0.5}$Mn$\text{}_{0.5}$Te buffers on GaAs substrates. The variation of the lattice parameter recorded by the high energy electron diffraction during the growth was later confirmed by an analysis of high resolution transmission electron microscopy images. We report also on an observation of oscillations of the lattice parameter during the deposition of several first layers of ZnTe on CdTe.
Źródło:: Acta Physica Polonica A; 1995, 88, 4; 795-798
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 3.

Tytuł:: Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects
Autorzy:: Grime, G.
Powiązania:: https://bibliotekanauki.pl/articles/1628030.pdf
Data publikacji:: 2009-02
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 81.16.Nd
41.75.Ak
41.85.-p
Opis:: A key phenomenon in the interaction of MeV ions and solids is that the energy transferred from the primary ions to the target electrons is high compared with atomic and molecular binding energies, but low compared with the ion energy. This means that there is a high probability of modifying the chemical properties of the material (for patterning) or of inducing the emission of electromagnetic radiation (for analysis), yet the path of particle is changed by a negligible amount, which means that focused beams remain sharp even after penetrating long depths into the material. Developments in focusing MeV ions in recent years have pushed the useable beam diameters into the sub-micrometre region, which means that nuclear microbeams are poised to make an impact in both direct write fabrication and micro-analysis at length scales of interest in nanotechnology or microbiology. This paper reviews the science and technology underlying the use of nuclear microbeams (ion solid interactions, focusing systems) and reports on the present status and trends of applications in sub-micron scale applications.
Źródło:: Acta Physica Polonica A; 2009, 115, 2; 467-472
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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