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Wyszukujesz frazę "Gawlik, K." wg kryterium: Autor


Wyświetlanie 1-4 z 4
Tytuł:
Angle-Resolved Photoelectron Spectroscopy on CdTe(100) c(2×2)
Autorzy:
Gawlik, K.-U
Brügmann, J.
Harm, S.
Manzke, R.
Skibowski, M.
Kowalski, B.
Orłowski, B.
Powiązania:
https://bibliotekanauki.pl/articles/1929827.pdf
Data publikacji:
1993-12
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
73.20.At
79.60.Bm
Opis:
The CdTe(100) c(2×2) surface prepared by ion bombardment and annealing was investigated by angle-resolved photoemission spectroscopy using synchrotron radiation with photon energies between 8.5 eV and 32 eV. The bulk band structure was determined along the ΓΔX-direction normal to the surface measuring energy-distribution curves. The results are compared with a theoretical valence band structure assuming free-electron-like final states in connection with k-conservation. For further comparison we calculated the final states by the pseudopotential method and analyzed the results in form of structure plots. In this way, most of the dispersing maxima in the normal emission spectra can be explained. For this mode of photoelectron spectroscopy the resulting dispersion must be due to the component of the Bloch wave vector normal to the surface, k$\text{}_{⊥}$, keeping surface related structures at a fixed binding energy position E$\text{}_{b}$. The lack of dispersion for five structures along ΓΔX gives experimental evidence for their surface origin.
Źródło:
Acta Physica Polonica A; 1993, 84, 6; 1093-1099
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Electronic Structure of the CdTe(100)-(1×1) Surface
Autorzy:
Gawlik, K.-U.
Brugmann, J.
Harm, S.
Janowitz, C.
Manzke, R.
Skibowski, M.
Solterbeck, C.-H.
Schattke, W.
Orłowski, B. A.
Powiązania:
https://bibliotekanauki.pl/articles/1920920.pdf
Data publikacji:
1992-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.55.Et
79.60.Eq
Opis:
Unreconstructed CdTe(100) surface prepared by ion bombardment and annealing is investigated by angle-resolved photoemission. The experimental band structure E(k$\text{}_{∥}$) is determined along high-symmetry lines of the surface Brillouin zone by measuring energy-distribution curves of photoelectrons. Different criteria were applied to separate surface and bulk related spectral features, e.g. calculating the position of bulk-derived emissions in the frame of the free-electron final state approximation assuming k conservation. In this way, most dispersing features could be explained. All remaining features were compared with theoretical surface band structures for different polar surface terminations which were calculated within a layer doubling procedure on the basis of an EHT-fit to the bulk band structure. The investigated CdTe(100)-(1×1) surface could be identified as Cd terminated. Two surface bands were observed, one located above the valence-band edge and the second in the open pocket of the projected bulk band structure along the Γ̅K̅ direction. At 4.6 eV binding energy an additional weakly dispersing band was found, which contains mixed surface and bulk character. The high density of bulk states associated with this edge of the heteropolar gap is also expected to contribute to this feature.
Źródło:
Acta Physica Polonica A; 1992, 82, 2; 355-361
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
White Beam Synchrotron Topographic Characterisation of Silicon Wafers Directly Bonded by Oxide Layer
Autorzy:
Wierzchowski, W.
Wieteska, K.
Graeff, W.
Gawlik, G.
Pawłowska, M.
Powiązania:
https://bibliotekanauki.pl/articles/2011029.pdf
Data publikacji:
1999-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.Yh
68.35.-p
Opis:
Various types of layer structures obtained by direct bonding of oxidised silicon wafers were studied by means of different X-ray topographic methods using white synchrotron beam and the observation of selective etching pattern using scanning electron microscopy and optical microscopy with Nomarski contrast. In the present investigation the particularly important results were obtained with synchrotron section topography, which revealed different defects caused by bonding of thick wafers, in particular the dislocations and microcracks. The different situation was observed in the case of bonding with a very thin layer separated from a silicon substrate by high dose proton implantation. In this case a thin layer accommodated practically all induced strain and the bonded oxidised thick substrate remained defect-free in its inner volume.
Źródło:
Acta Physica Polonica A; 1999, 96, 2; 283-288
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Experimental and Theoretical Study of Light Propagation in Suspended-Core Optical Fiber
Autorzy:
Grabka, M.
Wajnchold, B.
Pustelny, S.
Gawlik, W.
Skorupski, K.
Mergo, P.
Powiązania:
https://bibliotekanauki.pl/articles/1506776.pdf
Data publikacji:
2010-12
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
42.70.Qs
42.81.Qb
42.81.-i
42.81.Pa
07.60.Vg
Opis:
We analyze coupling and propagation of light through a suspended-core microstructured optical fiber. It is experimentally demonstrated that light-coupling efficiency and mode distribution strongly depend on relative position of the fiber's core and a light beam and light polarization. The experimental results are supported with numerical simulations. The developed numerical model confirmed all the observed dependences.
Źródło:
Acta Physica Polonica A; 2010, 118, 6; 1127-1132
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

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