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Wyszukujesz frazę "soft X-ray" wg kryterium: Wszystkie pola

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    Wyświetlanie 1-9 z 9
    Tytuł:
    Development of a Soft X-ray Microprobe for Radiobiology Studies
    Autorzy:
    Appuhamilage, I.
    Adjei, D.
    Alatabi, S.
    Alnaimi, R.
    Michette, A.
    Pfauntsch, S.
    Powiązania:
    https://bibliotekanauki.pl/articles/1197646.pdf
    Data publikacji:
    2014-04
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    41.50.+h
    07.85.Fv
    Opis:
    The King's College London (KCL) first X-ray microprobe (MKI) and the third generation microfocus X-ray sources (MKIII) are intended to be used for various applications including the study of physical and biological interactions at the atomic and molecular scales. The microfocus ultra-soft X-ray sources (MKI and MKIII) with interchangeable targets will provide a superior spatial resolution (a focal spot a few hundreds of nanometres in diameter can be achieved) and the control of the dose delivered to irradiated cells. This will require characterization of the spectra and intensities of the source, measurements of the focus intensities and spot sizes of suitable X-ray optics such as zone plates, grazing incidence microstructured optical arrays and multilayer mirrors.
    Źródło:
    Acta Physica Polonica A; 2014, 125, 4; 882-885
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Soft X-Ray Spectromicroscopy and its Application to Semiconductor Microstructure Characterization
    Autorzy:
    Gozzo, F.
    Franck, K.
    Howells, M. R.
    Hussain, Z.
    Warwick, A.
    Padmore, H. A.
    Triplett, B. B.
    Powiązania:
    https://bibliotekanauki.pl/articles/1963346.pdf
    Data publikacji:
    1997-04
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.16.-d
    85.40.-e
    79.60.-i
    Opis:
    The universal trend towards device miniaturization has driven the semiconductor industry to develop sophisticated and complex instrumentation for the characterization of microstructures. Many significant problems of relevance to the semiconductor industry cannot be solved with conventional analysis techniques, but can be addressed with soft X-ray spectromicroscopy. An active spectromicroscopy program is being developed at the Advanced Light Source, attracting both the semiconductor industry and the materials science academic community. Examples of spectromicroscopy techniques are presented. An Advanced Light Source μ-XPS spectromicroscopy project is discussed, involving the first microscope completely dedicated and designed for microstructure analysis on patterned silicon wafers.
    Źródło:
    Acta Physica Polonica A; 1997, 91, 4; 697-705
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Biomedical application of soft X-ray microscopy with special reference to spectromicroscopy
    Autorzy:
    Ito, A.
    Inoue, T.
    Kado, M.
    Ohigashi, T.
    Tone, S.
    Shinohara, K.
    Powiązania:
    https://bibliotekanauki.pl/articles/1065144.pdf
    Data publikacji:
    2016-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    87.59.-e
    Opis:
    Soft X-ray microscopy has great advantages over other types of microscopy on the observation of hydrated specimens at high spatial resolution below 100 nm, and on the elemental and molecular mapping using absorption characteristics. These advantages are particularly suitable for biomedical applications. A possible problem associated with observation of specimens at high spatial resolution in a hydrated environment is described and a strategy to overcome the problem is presented. The latter part of the present report deals with spectromicroscopy to obtain molecular distribution in biological specimens. DNA and protein distributions in isolated nuclei are examined following to the progression of apoptosis at high resolution, and the oxidation product is visualized in human hair in relation to calcium content.
    Źródło:
    Acta Physica Polonica A; 2016, 129, 2; 260-263
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Contact Microscopy using a Compact Laser Produced Plasma Soft X-Ray Source
    Autorzy:
    Ayele, M.
    Czwartos, J.
    Adjei, D.
    Wachulak, P.
    Ahad, I.
    Bartnik, A.
    Wegrzynski, Ł.
    Szczurek, M.
    Jarocki, R.
    Fiedorowicz, H.
    Lekka, M.
    Pogoda, K.
    Gostek, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/1398826.pdf
    Data publikacji:
    2016-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    52.50.Jm
    68.37.Yz
    85.40.Hp
    Opis:
    Soft X-ray contact microscopy potentially allows imaging of wet living biological specimens at a spatial resolution higher than optical microscopy and without many of the constraints of scanning electron microscopy. In this paper, we present the development of a laboratory scale contact microscope that uses a laser produced plasma soft X-ray source. The source is based on a double-stream gas-puff target approach and it operates in the "water window" spectral range which enables to capture images of biological samples with a natural contrast. In the preliminary experiments the contact microscope system has been used for imaging of fixed and dried non-malignant HCV29 human bladder cell lines cultured on polymethyl methacrylate photoresists. The samples were exposed with 150 pulses of soft X-rays as an initial test to demonstrate the possibility of image formation. The soft X-ray contact images registered in the photoresists exhibit high resolution in the atomic force microscopy topography which indicates the potential application of soft X-ray contact microscopy in life science to examine small features as small as few tens of nm. The technique could also be used for living cell imaging with further optimization of the microscope system and development of a special specimen holder. The details of the soft X-ray contact microscopy technique and the experimental results are presented and discussed.
    Źródło:
    Acta Physica Polonica A; 2016, 129, 2; 237-240
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Studies of Solids and Adsorbates in Synchrotron Radiation Excited Soft X-Ray Fluorescence
    Autorzy:
    Nordgren, J.
    Wassdahl, N.
    Powiązania:
    https://bibliotekanauki.pl/articles/1920879.pdf
    Data publikacji:
    1992-08
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    78.70.En
    Opis:
    A progress report is presented on recent developments in soft X-ray emission spectroscopy using synchrotron radiation. Some key experiments are discussed demonstrating that new information can be gained by using synchrotron radiation for this purpose. Recent work on highly resolved soft X-ray emission from monolayers of adsorbed species is commented on and some perspectives are given regarding further developments expected from the third generation sources that are underway.
    Źródło:
    Acta Physica Polonica A; 1992, 82, 2; 251-262
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Nanoimaging Using Soft X-Ray and EUV Sources Based on Double Stream Gas Puff Targets
    Autorzy:
    Wachulak, P.
    Torrisi, A.
    Ayele, M.
    Bartnik, A.
    Węgrzyński, Ł.
    Fok, T.
    Czwartos, J.
    Fiedorowicz, H.
    Powiązania:
    https://bibliotekanauki.pl/articles/1030619.pdf
    Data publikacji:
    2018-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    gas puff target
    Fresnel zone plates
    EUV/SXR microscopy
    contact microscopy
    imaging
    nanometer resolution
    Opis:
    In this work we present recent results on nanoscale imaging in the extreme ultraviolet and soft X-ray spectral ranges, describing three novel imaging systems dedicated for high spatial resolution imaging of nanoscale objects with the extreme ultraviolet and soft X-ray radiations. The extreme ultraviolet and soft X-ray full field microscopes operate at 13.8 nm and 2.88 nm wavelengths and are capable of imaging of nanostructures with a sub-50 nm spatial resolution. A soft X-ray contact microscope operates in the "water-window" spectral range from 2.3 to 4.4 nm wavelength, to obtain images of an internal structure of the investigated object in a thin surface layer of soft X-ray light sensitive photoresist. The development of such compact imaging systems may, in the near future, be important from the point of view of new research related to biological, material science, and nanotechnology applications. Such preliminary applications are also shown in the studies of biological samples, including carcinoma cells, diatoms, and neurons.
    Źródło:
    Acta Physica Polonica A; 2018, 133, 2; 271-276
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Hard and Soft X-Ray Reflectivity Studies οf $(NiFe//Au//Co//Au)_{10}$ Magnetic Multilayers
    Autorzy:
    Szymański, B.
    Stobiecki, F.
    Weis, T.
    Engel, D.
    Urbaniak, M.
    Kuświk, P.
    Lengemann, D.
    Ehresmann, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/1810593.pdf
    Data publikacji:
    2009-01
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.05.cm
    75.60.-d
    75.70.-i
    Opis:
    We report on hard and soft X-ray reflectivity investigations of $(Ni_{80}Fe_{20} (2.2 nm)//Au(2.3 nm)//Co(0.8 nm)//Au(2.3 nm))_{10}$ multilayers. Specular reflectivity curves were measured with Cu $K_{α}$ radiation and circularly polarized synchrotron radiation tuned to Co $L_{3}$ and Ni $L_{3}$ absorption edges. Structural properties of the multilayers were determined from the hard X-ray reflectivity curve. Comparison of reflectivity curves taken at different photon energies shows: (i) small difference in peak positions in dependence of reflectivity versus scattering vector q, (ii) different shapes of satellite Bragg peaks, (iii) different ranges of q for appearance of the Kiessig fringes. Analysis of soft X-ray reflectivity curves taken as a function of magnetic field allows to determine magnetic properties of Co and NiFe layer specifically.
    Źródło:
    Acta Physica Polonica A; 2009, 115, 1; 366-368
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Soft X-Ray Diffraction up to Wavelengths of 6.0Å Becomes Feasible at ID1 of ESRF
    Autorzy:
    Carpentier, P.
    Boesecke, P.
    Bois, J.-M.
    Chesne, M.-L.
    Fanchon, E.
    Kahn, R.
    Stuhrmann, H.
    Vicat, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/2030554.pdf
    Data publikacji:
    2002-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.10.Nz
    Opis:
    Recent experiments carried out at the Anomalous Scattering Beamline ID1 of ESRF are described which show that a cold helium atmosphere provides optimal conditions for protein crystallography with soft X-rays at wavelengths up to 6Å. Image plates are suitable detectors for this wavelength range. The improvement with respect to earlier experiments is considerable. This observation opens the way to the use of anomalous dispersion at the K-edge of light elements, like phosphorus, sulphur, chlorine and calcium. Moreover, there is an interest to use the strong anomalous dispersion of some heavy elements such as uranium (110 anomalous electron units at its M_V edge) to solve large biological structures. The methods of multiwavelength anomalous diffraction and diffraction anomalous fine structure find new resonant labels which are wide spread in living matter and materials.
    Źródło:
    Acta Physica Polonica A; 2002, 101, 5; 603-612
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    The Structural Stability of Soft Magnetic Fe-Co-Zr-W-B Metallic Glasses Investigated by the in-situ X-ray Diffraction
    Autorzy:
    Michalik, S.
    Bednarcik, J.
    Pawlik, P.
    Matija, R.
    Sovak, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/1366893.pdf
    Data publikacji:
    2014-07
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.05.cp
    61.43.Dq
    Opis:
    The atomic structure of as-prepared $Fe_{61}Co_{(14-x)}Zr_{5}W_{x}B_{20}$ (x=1, 2 and 4) ribbon samples and their thermal stability were investigated by in-situ high-energy X-ray diffraction experiments. It was observed that higher W concentration causes the tiny shift of the main peak of the reduced atomic pair distribution function to higher values of interatomic distances and increases the coefficient of volume thermal expansion. The crystallization process occurs in two steps and is qualitatively the same for all studied specimens. Firstly the $Fe_{23}B_{6}$ phase is created and later is transformed to other types of borides together with the creation of a Fe-based phase.
    Źródło:
    Acta Physica Polonica A; 2014, 126, 1; 66-67
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-9 z 9

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