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Wyszukujesz frazę "X-ray method" wg kryterium: Wszystkie pola


Wyświetlanie 1-12 z 12
Tytuł:
Structure Perfection Study of Crystals Containing Micro- and Macrodistortions by X-Ray Acoustic Method
Autorzy:
Khrupa, V. I.
Grigoryev, D. O.
Dzyublik, A. Ya.
Powiązania:
https://bibliotekanauki.pl/articles/1931662.pdf
Data publikacji:
1994-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
81.40.-z
61.72.Dd
Opis:
The X-ray acoustic method for determination the structure perfection integral characteristics is suggested for slightly imperfect dislocation-free crystals. The method is suitable for investigation of a crystal disturbed both by localized (microdefects) and by distributed (macrostrains) structure defects. It is based on the analysis of dependence of the distance Δx between two minima, arising in the spatial intensity profile I(x) of the X-ray beam diffracted by acoustically excited crystal, upon ultrasound frequency vs. Using the data Δx(v$\text{}_{s}$) for two selected reflections, we calculated the values of the extinction lengths Λ which enabled us to identify the predominate type of structure disturbances as well as to estimate the static Debye-Waller factors e$\text{}^{-L}$ and the period of the main macrodeformation λ$\text{}_{M}$ for a sample containing simultaneously microdefects and periodic long range deformations. Such approach was used for studying the structure perfection of Czochralski-grown (Cz) and float-zone (FZ) silicon crystals.
Źródło:
Acta Physica Polonica A; 1994, 86, 4; 597-603
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Determination of Size Distribution of Guinier-Preston Zones in Al-Ag Alloys by Small-Angle X-ray Scattering Method
Autorzy:
Bierska, B.
Pająk, L.
Powiązania:
https://bibliotekanauki.pl/articles/2035487.pdf
Data publikacji:
2002-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.Eq
81.40.Cd
64.75.+g
Opis:
Small-angle X-ray scattering method recognised to be very useful in the studies of structural problems of materials inhomogeneous in nanoscale. Studies by small-angle X-ray scattering on the Al-Ag alloys are presented. The size distributions of spherical Guinier-Preston zones were calculated using Vonk's and Glatter's methods. Small-angle X-ray scattering studies were performed on Al-5.0 at.%Ag alloy containing spherical Guinier-Preston zones in theη-state. For this alloy one can assume that scattering particles are of spherical shape, have uniform electron density and scatter independently. Moreover, the size distributions were calculated for Al-1.6 at.%Ag alloy containing Guinier-Preston zones in ε-state (scattering particles with not uniform electron density). Both, Vonk's and Glatter's, methods gave similar size distributions. Profiles of size distributions for Guinier-Preston zones inε-state are more complex in comparison to Guinier-Preston zones inη-state. It is connected with a complex structure of Guinier-Preston zones in ε-state. A modification of the structure model of Guinier-Preston zones inε-state is proposed.
Źródło:
Acta Physica Polonica A; 2002, 102, 2; 227-232
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Characterization of New Structure for Silicon Carbide X-Ray Detector by Method Monte Carlo
Autorzy:
Stankovic, S.
Ilic, R.
Jankovic, K.
Vasic-Milovanovic, A.
Loncar, B.
Powiązania:
https://bibliotekanauki.pl/articles/1503337.pdf
Data publikacji:
2011-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
07.85.Fv
87.55.kh
85.30.Kk
61.72.uf
77.84.Bw
Opis:
This work presents a characterization of radiation absorption properties of silicon carbide (SiC) as semiconductor for the realization of detectors for X-rays. SiC detectors can potentially reach superior performance with respect to all the other semiconductors presently employed in hazardous environments in nuclear and space science and technology. Physics and numerical modeling of photons transport through SiC detector is incorporated in non-destructive Monte Carlo method for determining the energy deposited and dose distribution. The Monte Carlo code has been adopted for numerical simulations for different detector conditions and configurations. The X-ray characterization of new SiC structures originates the improving of design of these detector systems.
Źródło:
Acta Physica Polonica A; 2011, 120, 2; 252-255
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Computational Method of X-Ray Harmonic Elimination in EXAFS Treating
Autorzy:
Ovsjannikov, Ph. M.
Powiązania:
https://bibliotekanauki.pl/articles/1931720.pdf
Data publikacji:
1994-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
87.64.Fb
78.70.Dm
Opis:
The computational method of EXAFS amplitude correction by harmonics elimination and intensity leakage assessment has been worked out. In conventional absorption measurements, the major sources of errors are the transition of harmonics by the monochromator and inevitable leakage of radiation around and (or) through the sample. In this paper we present the method of the effective corrections being based on the measurements of the intensity of X-ray radiation passed through calibrated metal foils both without and together with investigated samples. As the advantage of the method one may emphasise the fact that it does not require any additional data for the investigated samples such as chemical composition, density, table absorption coefficients.
Źródło:
Acta Physica Polonica A; 1994, 86, 5; 749-752
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-ray Diffraction of AuCl Semiconductor Nanocrystals Embedded in NaCl Single Crystals Grown by Czochralski Method
Autorzy:
Zehani, F.
Zaioune, H.
Powiązania:
https://bibliotekanauki.pl/articles/1399819.pdf
Data publikacji:
2013-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.05.cp
62.23.Pq
64.70.kg
78.67.Bf
Opis:
The AuCl nanocrystals embedded in NaCl single crystals are elaborated using the Czochralski method. The X-ray diffraction has confirmed the formation of the AuCl nanocrystals with a tetragonal structure inside the NaCl matrix. The average radius of the AuCl nanocrystals is estimated using the Scherrer formula.
Źródło:
Acta Physica Polonica A; 2013, 123, 2; 312-313
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Quantitative Characteristic X-Ray Analysis for Different Compound Samples by Using Monte Carlo Method
Autorzy:
Tekın, H.
Altunsoy, E.
Manici, T.
Yilmaz, B.
Powiązania:
https://bibliotekanauki.pl/articles/1030113.pdf
Data publikacji:
2017-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
Monte Carlo
characteristic X-ray
brass
Opis:
X-ray spectrometry is an elemental analysis technique with broad application in science and industry. It is based on the principle that individual atoms, when excited by an external energy source emit X-ray photons of a characteristic energy or wavelength. Here we obtained the characteristic X-ray peaks of different brass compounds and compared the intensity of characteristic peaks by changing with Zn rate. In this study we modelled different brass samples by using Monte Carlo method and changed the zinc rate in brass samples for each compound. We obtained the characteristic X-ray peaks of different compounds and compared the intensity of characteristic peaks by changing with Zn rate. We achieved a good agreement between peak intensity and corresponding element rate in compound. Also we obtained that characteristic peak rate increases by corresponding element rate in compound. This study shows that Monte Carlo method is very effective method to simulate material features due to their characteristic peaks and their intensities.
Źródło:
Acta Physica Polonica A; 2017, 132, 3; 439-441
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Characterization of X-Ray Diamond Detector by Monte Carlo Method
Autorzy:
Stankovic, S.
Ilic, R.
Davidovic, D.
Petrovic, M.
Powiązania:
https://bibliotekanauki.pl/articles/1808062.pdf
Data publikacji:
2009-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
29.40.Wk
Opis:
The use of diamond as material for X-ray detector is subject of investigation and practice in radiotherapy, space and material science and technology. This paper presents the results of application of Monte Carlo method for simulation of photon transport through diamond detector. The aim is restitution and demonstrating of numerical technique for characterization of electrical properties for different detector conditions and configurations. Monte Carlo code was adopted to determine the energy deposited and dose distribution in the structure of diamond detector. Our results show that the use of numerical simulations may be of essential help in design of diamond detector systems.
Źródło:
Acta Physica Polonica A; 2009, 115, 4; 816-819
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method
Autorzy:
Lefeld-Sosnowska, M.
Malinowska, A.
Powiązania:
https://bibliotekanauki.pl/articles/1399485.pdf
Data publikacji:
2013-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.72.Ff
Opis:
X-ray diffraction topography is one of basic diagnostics tools serving for visualisation of single crystal lattice defects. Defects of various kinds can be observed. The present study is a review of topographic results obtained in the X-ray laboratory of the Institute of Experimental Physics, University of Warsaw, for three families of single crystals grown by the Czochralski method: (i) silicon (Si) and $Si_{1-x}Ge_{x}$, (ii) selected binary REVO_4 oxides and (iii) selected ternary $ABCO_4$ oxides. The effect of chemical composition, growth conditions and post growth thermal annealing on the defect appearing in crystals is discussed. Various defects are revealed: the growth dislocations (some early Si crystals), the composition-gradient-induced lattice deformation $(Si_{1-x}Ge_{x}$, solid solutions $Ca_{x}Sr_{1-x}NdAlO_4)$, defects generated in Si after the post growth thermal processes, oriented elongated rod-like macro-defects tending to form networks within the crystal core, cellular structure in the outer shell $(SrLaGaO_4)$, and variously developed block structure (in selected binary $\text{REVO}_4$ crystals).
Źródło:
Acta Physica Polonica A; 2013, 124, 2; 360-371
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Influence of pH on the Structural and Optical Properties of Polycrystalline MnTe₂ Thin Films Produced by Chemical Bath Deposition Method
Autorzy:
Kariper, İ.
Göde, F.
Powiązania:
https://bibliotekanauki.pl/articles/1031481.pdf
Data publikacji:
2017-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
X-ray diffraction
thin film
optical constant
growth from solutions
Opis:
Polycrystalline manganese ditelluride (MnTe₂) thin films are synthesized on commercial glass substrates by chemical bath deposition technique at different pH values (pH = 9, 10, 11 and 12). The effect of pH on the structural and optical properties of chemically deposited MnTe₂ thin films have been investigated in this study. The structure and optical properties of the films are characterized by X-ray diffraction and optical absorption spectroscopy. The X-ray diffraction results suggest that the films are polycrystalline with a mixture of dominant cubic MnTe₂ phase and few traces of orthorhombic MnTeO₃ and MnTe₂O₅ phases. The optical band gap of the films increases approximately from 1.66 eV to 2.62 eV with increasing pH. Moreover, optical parameters of the films such as refractive index, extinction coefficient, real and imaginary dielectric constants are investigated using absorption and transmittance spectra taken from the UV-vis spectrophotometer. At 600 nm wavelength, refractive index and extinction coefficient values vary in the range of 1.39-1.55 and 0.17-0.23, respectively. An increase in optical band gap could be attributed to the quantum confinement effect.
Źródło:
Acta Physica Polonica A; 2017, 132, 3; 531-534
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-Ray and Electron-Optical Characterization of ZnTe/CdTe and ZnTe/GaAs Epitaxial Layers Obtained by the MBE Method
Autorzy:
Auleytner, J.
Dziuba, Z.
Górecka, J.
Pełka, J.
Regiński, K.
Powiązania:
https://bibliotekanauki.pl/articles/1931657.pdf
Data publikacji:
1994-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.14.Hg
61.10.-i
68.55.-a
Opis:
X-ray diffraction topography (Bragg diffraction) and X-ray rocking curve measurements were used to study the perfection and structural properties of ZnTe epitaxial layers on the CdTe and GaAs substrates. ZnTe epitaxial layers on CdTe were grown by MBE method by using a machine made in the Institute of Physics of the Polish Academy of Sciences. The ZnTe layers on GaAs were produced on the other, factory-made MBE system. The comparison between the X-ray topographical images of the substrate and epitaxial layer shows that imperfections on the substrate surface cause imperfections in the epitaxial layer. The results of double-crystal diffractometry measurements show that the perfection of the layer on the GaAs substrate is higher than that on the CdTe. The presence of microtwining in the ZnTe layer on the CdTe substrate was confirmed by RHEED measurements. The X-ray standing wave fluorescent spectra were also measured for the samples.
Źródło:
Acta Physica Polonica A; 1994, 86, 4; 567-574
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Evolution of Disordering in SiC upon Sintering; Phase Analysis of SiC by Rietveld Method with Application of Neutron and X-Ray Diffraction
Autorzy:
Pałosz, B.
Boysen, H.
Schneider, J.
Schulz, H.
Powiązania:
https://bibliotekanauki.pl/articles/1924324.pdf
Data publikacji:
1993-01
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.My
61.12.-q
61.50.Ks
81.20.Lb
Opis:
Neutron and X-ray diffraction patterns of α and β powders as well as of sintered SiC were analysed by a multiphase Rietveld method. It is shown that structural models combined of large period polytypes can be used to approximate the disordering of these polytype structures. The hexagonality of the samples could be terminated with reproducibility 1-2% using different combinations of large-period polytypes. It follows that the usual classification into α and β SiC is an oversimplification. The polytype behaviour of SiC powders and the role of twinning of cubic layer stackings is discussed. Distribution functions of stacking sequences of different length in α and β phases are derived.
Źródło:
Acta Physica Polonica A; 1993, 83, 1; 95-106
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
The Mössbauer and X-Ray Studies οf the Spinel Ferrites $Cu_{0.5}Fe_{0.5}Cr_2Se_4$ and $Cu_{0.2}Fe_{0.8}Cr_2Se_4$ Prepared by the Ceramic Method
Autorzy:
Maciążek, E.
Hanc, A.
Sitko, R.
Zawisza, B.
Jendrzejewska, I.
Mrzigod, J.
Powiązania:
https://bibliotekanauki.pl/articles/1811603.pdf
Data publikacji:
2008-12
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.05.cp
61.66.Fn
82.80.Ej
75.50.Gg
Opis:
Seleno-spinels with nominal chemical composition $Cu_{0.5}Fe_{0.5}Cr_2Se_4$ and $Cu_{0.2}Fe_{0.8}Cr_2Se_4$ were prepared as polycrystalline samples using ceramic method. The assumed composition was verified by wavelength-dispersive X-ray fluorescence spectrometry. The X-ray analysis was carried out in order to make phase analysis and to compare its results with those obtained with the Mössbauer spectroscopy.
Źródło:
Acta Physica Polonica A; 2008, 114, 6; 1599-1603
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-12 z 12

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