Wszystkie pola: X-ray emission - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Synchrotron Radiation Induced X-Ray Emission - SRIXE
Autorzy:: Kwiatek, W.
Powiązania:: https://bibliotekanauki.pl/articles/1920883.pdf
Data publikacji:: 1992-08
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 78.70.En
87.15.Mi
Opis:: The synchrotron radiation induced X-ray emission (SRIXE) technique was found very useful and sensitive for determination of trace elements content and distribution in different types of materials. Due to properties of synchrotron radiation the SRIXE technique became very unique and powerful for trace elements analysis. This paper describes the phenomena related to production of characteristic X-rays and principles of the method. The properties of SRIXE such as minimum detectable limit, spatial resolution, radiation damage, and depth sensitivity are also discussed. Selected applications are given to emphasize the usefulness of the technique.
Źródło:: Acta Physica Polonica A; 1992, 82, 2; 263-271
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 2.

Tytuł:: Amorphous Bi-Ge-S(Se) Systems Studied by X-Ray Ge K Emission and Absorption Bands
Autorzy:: Drahokoupil, J.
Drbohlav, I.
Polčik, M.
Tichý, L.
Powiązania:: https://bibliotekanauki.pl/articles/1931701.pdf
Data publikacji:: 1994-11
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 78.70.Dm
Opis:: The X-ray Ge K absorption (emission) bands were measured in the stoichiometric glass system (GeS$\text{}_{2}$)$\text{}_{x}$(Bi$\text{}_{2}$S$\text{}_{3}$)$\text{}_{1-x}$ (x = 0 ÷ 0.5) and in the Ge$\text{}_{20}$Bi$\text{}_{y}$Se$\text{}_{80-y}$ system (y = 0, 7 and 13). The results do not confirm the existence of the Ge-Bi bond and they imply that the GeS$\text{}_{2}$-clusters are formed in both studied systems.
Źródło:: Acta Physica Polonica A; 1994, 86, 5; 721-726
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 3.

Tytuł:: Study of Photoelectron Emission Yield from Layered Structures in Presence of Resonance-Enhanced X-Ray Propagation Effect
Autorzy:: Pełka, J. B.
Lagomarsino, S.
Cedola, A.
Di Fonzo, S.
Jark, W.
Powiązania:: https://bibliotekanauki.pl/articles/1963396.pdf
Data publikacji:: 1997-05
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.65.+g
78.20.-e
Opis:: In this work we present the new experimental results of total photoelectric yield as well as energy distribution of photoelectrons excited in a thin carbon film deposited on Ni mirror in the presence of resonance-enhanced X-ray propagation effect. The measurements were performed using conventional X-ray tube as a radiation source for the energy Cu K$\text{}_{α}$ (8047 keV). The spectra were recorded using a flow proportional electron counter with energy resolution of about 15%, and multichannel pulse height analyzer. A comparison with the reflectivity spectra recorded at the same time show an excellent correlation of both kinds of spectra, consistently with the theoretical prediction. A map of electron energy distribution is reported. Although the applied electron counter was of low energetic resolution the recorded spectra show characteristic regularities and indicate that the photoelectron yield excited in the presence of resonance-enhanced X-ray propagation effect can provide depth dependent information about impurity distribution and processes in thin layers.
Źródło:: Acta Physica Polonica A; 1997, 91, 5; 851-857
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Informacja

Wyszukujesz frazę "X-ray emission" wg kryterium: Wszystkie pola

Źródło danych

Dostawca treści

Kolekcja

Rok wydania

Wydawca

Temat

Autor

Typ dokumentu

Język