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Wyszukujesz frazę "frequency converters" wg kryterium: Temat


Wyświetlanie 1-3 z 3
Tytuł:
Comparative investigation of SiC and Si power electronic devices operating at high switching frequency
Autorzy:
Zymmer, K.
Mazurek, P.
Powiązania:
https://bibliotekanauki.pl/articles/200057.pdf
Data publikacji:
2011
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
semiconductor devices
silicon carbide
high frequency converters
Opis:
The paper presents results of measurements of the reverse recovery current and dynamic forward voltage of the silicon carbide (SiC) Schottky diodes operating at a 500 A/ěs current slope. These data were compared with the corresponding parameters determined for ultrafast silicon (Si) diodes. Results of power losses measurement in SiC Schottky diodes operating at switching frequency range of (10–200) kHz are presented and compared with corresponding data of ultrafast Si diodes. Also, results of power losses measurements in transistors of dc voltage switch are shown. Investigations were conducted with a SiC and the ultrafast Si freewheeling diode at the transistor switching frequency of 100 kHz. The results of measuring power losses dissipated in the dc converter with a SiC Schottky diode and the ultrafast silicon diode are also presented.
Źródło:
Bulletin of the Polish Academy of Sciences. Technical Sciences; 2011, 59, 4; 555-559
0239-7528
Pojawia się w:
Bulletin of the Polish Academy of Sciences. Technical Sciences
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Methods of DC/DC converter transfer function measurements, based on data acquired in the time domain
Autorzy:
Walczak, Marcin
Powiązania:
https://bibliotekanauki.pl/articles/220796.pdf
Data publikacji:
2019
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
DC–DC converters
frequency characteristics
transfer function measurement
Opis:
The measurement of frequency characteristics, like magnitude and phase, related to a specific transfer function of DC–DC converters, can be a difficult task - especially when the measured signal approaches the boundary of a small-signal model validity (i.e. 1/3 of the switching frequency fS ). It is hard to find a paper where authors mention the measurement techniques they use to draw frequency characteristics. Meanwhile the presence of noise in the output signal does not enable to directly measure the gain and the phase shift between the input and output signals. In such situations additional analysis is required in order to achieve a reliable result. This paper contains a description of a few methods that can be used to analyse measured signals in order to determine the gain and the phase shift of a specific transfer function. They enable to verify mathematical models in a wide range of frequencies (up to 1/3 fS ). The methods use signals measured in the time domain and can be implemented in mathematical software such as Matlab or Scilab.
Źródło:
Metrology and Measurement Systems; 2019, 26, 4; 661-671
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Steady-state modelling method for matrix-reactance frequency converter with boost topology
Autorzy:
Korotyeyev, I.Ye.
Zięba, B.
Powiązania:
https://bibliotekanauki.pl/articles/140872.pdf
Data publikacji:
2011
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
przekształtnik AC/AC
matrycowo-reaktancyjny przemiennik częstotliwości
metoda Galerkina
równanie różniczkowe
AC/AC converters
matrix-reactance frequency converter
Galerkin's method
extension of differential equations
Opis:
This paper presents a method intended for calculation of steady-state processes in AC/AC three-phase converters that are described by nonstationary periodical differential equations. The method is based on the extension of nonstationary differential equations and the use of Galerkin's method. The results of calculations are presented in the form of a double Fourier series. As an example, a three-phase matrix-reactance frequency converter (MRFC) with boost topology is considered and the results of computation are compared with a numerical method.
Źródło:
Archives of Electrical Engineering; 2011, 60, 2; 137-148
1427-4221
2300-2506
Pojawia się w:
Archives of Electrical Engineering
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-3 z 3

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