- Tytuł:
- The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
- Autorzy:
-
Górecki, K.
Górecki, P. - Powiązania:
- https://bibliotekanauki.pl/articles/220969.pdf
- Data publikacji:
- 2015
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
IGBT
thermal resistance
measurements
transistor
semiconductor devices - Opis:
- In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.
- Źródło:
-
Metrology and Measurement Systems; 2015, 22, 3; 455-464
0860-8229 - Pojawia się w:
- Metrology and Measurement Systems
- Dostawca treści:
- Biblioteka Nauki
Artykuł