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Wyszukujesz frazę "reflectivity" wg kryterium: Wszystkie pola


Tytuł:
X-ray Reflectivity and Polarized Neutron Reflectivity Investigations of $[Co_{60}Fe_{60}B_{20}//MgO]_n$ Multilayers
Autorzy:
Vadalà, M.
Wolff, M.
Westerholt, K.
Zabel, H.
Wisniowski, P.
Cardoso, S.
Powiązania:
https://bibliotekanauki.pl/articles/1814030.pdf
Data publikacji:
2007-12
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
75.50.-i
75.50.Kj
75.50.Cc
Opis:
In recent years magnetic tunnel junctions have been intensively studied and incorporated in magnetic random access memory devices and magnetic sensors, where large tunnelling magnetoresistance ratios are preferred. The largest tunnelling magnetoresistance values until now have been observed in magnetic tunnel junctions with MgO barriers and CoFeB electrodes after annealing of the junction above the recrystallization temperature of the amorphous CoFeB layers. We used X-ray reflectivity and polarized neutron reflectivity to study [Co_{60}Fe_{60}B_ {20}//MgO]_{x14} multilayers with the MgO layers prepared by different methods and annealed at different temperatures in order to compare the interface quality and the structural changes induced upon annealing.
Źródło:
Acta Physica Polonica A; 2007, 112, 6; 1249-1257
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Determination of Surface Roughness by Grazing Incidence X-ray Reflectivity
Autorzy:
Żymierska, D.
Powiązania:
https://bibliotekanauki.pl/articles/1945234.pdf
Data publikacji:
1996-03
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.Dp
68.35.Bs
78.20.Ci
Opis:
The paper presents theoretical calculations of grazing incidence X-ray reflectivity curves for iron and nickel crystals. The computer simulations based on Fresnel theory take into account damping (as the result of surface roughness), which is different from the usual Rayleigh damping. The calculations are performed for a wide range of wavelengths and roughness and also for different distribution of roughness on the surface.
Źródło:
Acta Physica Polonica A; 1996, 89, 3; 347-352
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Models for the Analysis of~IR Reflectivity in $TlBiTe_2$ with Different Size of Twins
Autorzy:
Hatzikraniotis, E.
Powiązania:
https://bibliotekanauki.pl/articles/1491508.pdf
Data publikacji:
2012-01
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.20.Bh
78.30.-j
Opis:
In this work $TlBiTe_2$ were grown by a modified Bridgman technique and examined samples had different lateral dimensions of twins, ranging from 0.1 μm to 1 μm. The average lateral size of the twins seems to affect free carrier concentration and plasma frequency. Infrared spectra were analyzed by two models, the extended Drude model and a generalized empirical model of frequency-dependent damping factor. Increase in size of twins affects the electronic properties and hence plasma reflectivity and free carrier concentration of $TlBiTe_2$.
Źródło:
Acta Physica Polonica A; 2012, 121, 1; 284-286
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Reflectivity Study of HgSe$\text{}_{1-x}$Te$\text{}_{x}$ Crystals
Autorzy:
Kowalski, B. J.
Dybko, K.
Lemańska, A.
Orłowski, B. A.
Powiązania:
https://bibliotekanauki.pl/articles/1923860.pdf
Data publikacji:
1992-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.20.Ci
Opis:
The room temperature reflectivity spectra of HgSe$\text{}_{1-x}$Te$\text{}_{x}$ (x = 0, 0.4, 0.5, 1.0) crystals were measured in the visible and ultraviolet range from 1.5 to 12 eV. The maxima characteristic of the binary HgA$\text{}^{IV}$ compounds can be revealed in the mixed crystals spectra, but their position depends on the crystal composition. There is no duplication of the spectral features in spite of the different energy position of the maxima for HgSe and HgTe. This suggests that the virtual crystal approximation could be used to describe basic optical properties of HgSe$\text{}_{1-x}$Te$\text{}_{x}$.
Źródło:
Acta Physica Polonica A; 1992, 82, 5; 845-848
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Investigation of Phonons in HgCdMnTe Using Far-Infrared Reflectivity
Autorzy:
Dudziak, E.
Bożym, J.
Pruchnik, D.
Baran, J.
Powiązania:
https://bibliotekanauki.pl/articles/1929684.pdf
Data publikacji:
1993-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.30.Fs
71.45.Gm
Opis:
The first reflectivity spectra of Hg$\text{}_{1-x-y}$Cd$\text{}_{x}$Mn$\text{}_{y}$Te with 0.03 < x < 0.1 and 0 < y < 0.05 were measured in the spectral region 700-30 cm$\text{}^{-1}$ at 300 K and 90 K. The quaternary alloys measured show three mode behaviour. The experimental results are interpreted by using a classical dynamic dielectric function model.
Źródło:
Acta Physica Polonica A; 1993, 84, 3; 595-598
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Reflectivity Study of Hg$\text{}_{1-x}$Co$\text{}_{x}$Se Crystals
Autorzy:
Guziewicz, E.
Kowalski, B. J.
Orłowski, B. A.
Szuszkiewicz, W.
Powiązania:
https://bibliotekanauki.pl/articles/1931782.pdf
Data publikacji:
1994-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
71.20.Fi
Opis:
The reflectivity spectra of Hg$\text{}_{1-x}$Co$\text{}_{x}$Se (x = 0.0, 0.024, 0.031) crystals were measured in the vacuum ultraviolet photon energy range from 4 to 12 eV to find the influence of Co ions on the valence band electronic structure of the HgSe crystal. The structure of the reflectivity spectra was interpreted in terms of the electronic band structure of the binary material (HgSe) assuming direct allowed interband transitions.
Źródło:
Acta Physica Polonica A; 1994, 86, 5; 875-878
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Reflectivity Study of the Zn$\text{}_{1-x}$Co$\text{}_{x}$Se Crystals
Autorzy:
Kowalski, B. J.
Gołacki, Z.
Orłowski, B. A.
Powiązania:
https://bibliotekanauki.pl/articles/1890987.pdf
Data publikacji:
1991-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.20.Ci
Opis:
The room temperature reflectivity spectra of the Zn$\text{}_{1-x}$Co$\text{}_{x}$Se (x = 0, 0.03, 0.05) crystals have been measured in the visible and ultraviolet range from 1.7 to 12 eV. The structure of the spectra was interpreted in terms of the electronic band structure of the binary material (ŻnSe). The experimental results were compared with the reflectivity spectra of the Fe-based semi magnetic semiconductors [1], and the interpretation was confronted with the conclusions derived from the photoemission experiments performed for Cd$\text{}_{1-x}$Co$\text{}_{x}$Se [2] and the tight-binding CPA calculations of the band structure of Zn$\text{}_{1-x}$Co$\text{}_{x}$Se [3].
Źródło:
Acta Physica Polonica A; 1991, 80, 3; 393-396
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Changes of FIR Reflectivity of HgSe:Cr in a Magnetic Field
Autorzy:
Hausenblas, M.
Wyder, P.
Witowski, A. M.
Wittlin, A.
Mycielski, A.
Powiązania:
https://bibliotekanauki.pl/articles/1921666.pdf
Data publikacji:
1992-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.20.Ls
78.30.Fs
Opis:
The results of FIR magnetoreflectivity of HgSe:Cr are presented. They are interpreted using a classical dynamic dielectric function.
Źródło:
Acta Physica Polonica A; 1992, 82, 5; 741-744
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Oscillations in Reflectivity of Samples with X-ray Waveguide Layers
Autorzy:
Pełka, J. B.
Lagomarsino, S.
Di Fonzo, S.
Jark, W.
Domagała, J.
Powiązania:
https://bibliotekanauki.pl/articles/1945221.pdf
Data publikacji:
1996-03
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.65.+g
78.20.Ci
Opis:
The glancing-angle reflectivity profiles in samples containing an X-ray waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discussion is extended to the structures composed of more than one layer. Experimental reflectivity spectra recorded with Cu K$\text{}_{α}$ radiation are compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non-resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applications of the reflectivity spectra to the studies of structure of thin layers is done.
Źródło:
Acta Physica Polonica A; 1996, 89, 3; 323-328
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Reflectivity Spectra of CdTe Implanted at Room and Liquid Nitrogen Temperature
Autorzy:
Czarnecka-Such, E.
Kisiel, A.
Rodzik, A.
Gołacki, Z.
Powiązania:
https://bibliotekanauki.pl/articles/1923759.pdf
Data publikacji:
1992-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.80.Jh
61.70.Tm
78.20.Ci
Opis:
The fundamental reflectivity spectra of monocrystalline CdTe, implanted with Ag ions at room temperature and with Er ions at liquid nitrogen temperature, are investigated in the 0.5-6.0 eV energy range. The analysis of the obtained spectra leads to the suggestion that temperature of implantation influences the obtained results much more decisively than values of other parameters. For the implantation carried out at 300 K no significant changes in reflectivity spectra are observed regardless of magnitude of the ion dose (up to 5 × 10$\text{}^{15}$/cm$\text{}^{2}$) and this fact, in our opinion, is due to the self-annealing effect. For samples implanted at temperature 77 K with comparable doses of ions, however, the characteristic changes of shape and intensity of reflection coefficient spectra appear. The manner of this changes gives evidence that temperature 77 K is low enough to make the radiation induced lattice defects stable (frozen-in) which are responsible for the observed behaviour of CdTe fundamental reflectivity spectra.
Źródło:
Acta Physica Polonica A; 1992, 82, 5; 781-784
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Temperature Study of the Polarized Reflectivity of TEA(TCNQ)$\text{}_{2}$ Single Crystal
Autorzy:
Olejniczak, I.
Graja, A.
Powiązania:
https://bibliotekanauki.pl/articles/1929208.pdf
Data publikacji:
1993-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.30.Jw
33.10.Lb
33.20.Ea
33.90.+h
Opis:
The infrared reflection spectra of the organic quasi-one-dimensional semiconductor triethylammonium (TCNQ)$\text{}_{2}$ between 80 and 300 K are reported. Characteristic changes in the temperature dependencies of the bands assigned to the donor vibrations are observed. An interpretation of the electron-molecular vibration coupling in terms of the dimer theory is discussed. It is concluded that the thermal evolution of the spectrum corroborates the semiconductor-semiconductor type of phase transition attributed to the cation disorder.
Źródło:
Acta Physica Polonica A; 1993, 83, 4; 517-526
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Vacuum Ultraviolet Reflectivity of Cd$\text{}_{1-x}$Fe$\text{}_{x}$Te
Autorzy:
Dębowska, D.
Zimnal-Starnawska, M.
Kisiel, A.
Piacentini, M.
Zema, N.
Giriat, W.
Powiązania:
https://bibliotekanauki.pl/articles/1920915.pdf
Data publikacji:
1992-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.40.Kc
78.55.Et
Opis:
Reflectivity spectra for mixed crystals Cd$\text{}_{1-x}$Fe$\text{}_{x}$Te with 0.00 ≤ x ≤0.05 were investigated. The measurements were carried out in the energy range 6.0-30.0 eV at 300 K. The influence of Fe$\text{}^{2+}$(3d$\text{}^{6}$) states on the changes in the energy positions of the reflectivity maxima E'$\text{}_{1}$ , E'$\text{}_{1}$ + ∆, c, d, e, f, h and i is analysed. The obtained results confirm the band structure diagrams published previously.
Źródło:
Acta Physica Polonica A; 1992, 82, 2; 341-347
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Grazing Incidence X-Ray Reflectivity Study of MBE-Grown Co/Cu Multilayers
Autorzy:
Pełka, J. B.
Baczewski, L. T.
Wawro, A.
Domagała, J.
Powiązania:
https://bibliotekanauki.pl/articles/1963397.pdf
Data publikacji:
1997-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
75.30.Gw
75.30.-m
75.70.-i
Opis:
In this work we report preliminary grazing-incidence X-ray reflectometry studies of multilayer structures composed of 3d metals Co and Cu deposited in the ultra-high vacuum molecular beam epitaxy system. The multilayers of different modulation period were deposited on glass substrate directly, or on 3d -metallic buffers of various thicknesses. The experimental specular reflectivity spectra were analyzed by a comparison with a theoretical model calculated from a recursive algorithm based on the Fresnel formula [1, 2]. It enabled us to estimate the structural parameters concerning layer thickness and roughness. The results obtained are correlated with magnetization measurements of the layered structures, as a function of modulation period, buffer type and thickness. A special attention to influence of interfacial roughness on magnetization results is paid.
Źródło:
Acta Physica Polonica A; 1997, 91, 5; 859-863
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-Ray Photoelectron Spectroscopy and Optical Reflectivity Studies of Si Surfaces Prepared by Chemical Etching
Autorzy:
Iwanowski, R. J.
Sobczak, J. W.
Kowalski, B. J.
Powiązania:
https://bibliotekanauki.pl/articles/1931749.pdf
Data publikacji:
1994-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
79.60.Bm
78.40.Fy
Opis:
Complementary X-ray photoelectron spectroscopy and optical reflectivity studies of crystalline Si(111) surfaces prepared by two different wet chemical etching processes were performed. These included aqueous HF solution etch or diluted CP-4 bath. Optical reflectivity spectra of Si surfaces, measured in the range 3.7-11 eV, were found strongly dependent on the applied etching process. Analysis of the core level X-ray photoelectron spectroscopy data has shown similarity of the surface structure, irrespectively of the etching procedure. Finally, comparison of optical reflectivity and valence band X-ray photoelectron spectra revealed a qualitative correlation between them indicating dominant influence of the bulk (here, the subsurface region containing polishing-induced defects) in the case studied. This paper is the first one which presents correlations between optical reflectivity and X-ray photoelectron spectroscopy data for Si and thus illustrates a bulk sensitivity of both techniques considered.
Źródło:
Acta Physica Polonica A; 1994, 86, 5; 825-830
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Reflectivity Studies of Lattice Vibrations and Free Electrons in MBE Grown GaN Epitaxial Layers
Autorzy:
Iller, A.
Jantsch, W.
Marks, J.
Pastuszka, B.
Diduszko, R.
Powiązania:
https://bibliotekanauki.pl/articles/1969092.pdf
Data publikacji:
1998-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
63.20.-e
78.66.Fd
Opis:
We have observed a sharp structure with a peak at the frequency of the E$\text{}_{1}$-TO phonon in the reflectivity of GaN epitaxial layers grown by molecular beam epitaxy on Si substrates. The simulations of the reflection performed show that the observed shape can be explained by assuming both collective lattice vibrations and free carriers contributions to the dielectric function. We assumed the Lorentz oscillator to describe the contribution of the collective lattice vibrations and the Drude-Lorentz model for that of free carriers. Fitting the calculated reflectivity to the spectrum obtained experimentally allowed us to evaluate lattice and free carrier parameters.
Źródło:
Acta Physica Polonica A; 1998, 94, 2; 336-340
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł

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