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    Wyświetlanie 1-9 z 9
    Tytuł:
    Separation of isochromatics and isoclinics phasemaps for the photoelastic technique with use phase shifting and a large number of high precision images
    Autorzy:
    Magalhaes, C. A.
    Neto, P. S.
    Magalhaes Jr P. A., A.
    de Barcellos, C. S.
    Powiązania:
    https://bibliotekanauki.pl/articles/220820.pdf
    Data publikacji:
    2013
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    photoelasticity
    metrology
    stress analysis
    strain measurement
    optical measurement systems
    optical interferometry
    experimental techniques
    Opis:
    Digital photoelasticity is an important optical metrology follow-up for stress and strain analysis using full-field digital photographic images. Advances in digital image processing, data acquisition, procedures for pattern recognition and storage capacity enable the use of the computer-aided technique in automation and facilitate improvement of the digital photoelastic technique. The objective of this research is to find new equations for a novel phase-shifting method in digital photoelasticity. Some innovations are proposed. In terms of phaseshifting, only the analyzer is rotated, and the other equations are deduced by applying a new numerical technique instead of the usual algebraic techniques. This approach can be used to calculate a larger sequence of images. Each image represents a pattern and a measurement of the stresses present in the object. A decrease in the mean errors was obtained by increasing the number of observations. A reduction in the difference between the theoretical and experimental values of stresses was obtained by increasing the number of images in the equations for calculating phase. Every photographic image has errors and random noise, but the uncertainties due to these effects can be reduced with a larger number of observations. The proposed method with many images and high accuracy is a good alternative to the photoelastic techniques.
    Źródło:
    Metrology and Measurement Systems; 2013, 20, 1; 127-138
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Spectropolarimetric analyses of optical single mode SU8 waveguide layers
    Autorzy:
    Gut, K.
    Opilski, Z.
    Powiązania:
    https://bibliotekanauki.pl/articles/200815.pdf
    Data publikacji:
    2015
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    interferometry
    SU8 optical waveguides
    optical sensors
    interferometria
    czujniki optyczne
    światłowody
    Opis:
    The paper presents the principle of the operation of a spectropolarimetric interferometer. In a planar waveguide orthogonal modes of the TE and TM types can be excited for the entire visible light. During the propagation the difference of the phases between the modes was determined, which is the function of the length of the path of propagation, the difference of the effective refractive index (NTM-NTE) and the wavelength. At the output of this system the spectral distribution of intensity was recorded, the shape of which depends on the value of the refractive index of the cover of the waveguides.
    Źródło:
    Bulletin of the Polish Academy of Sciences. Technical Sciences; 2015, 63, 2; 349-352
    0239-7528
    Pojawia się w:
    Bulletin of the Polish Academy of Sciences. Technical Sciences
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    The influence of coating fabrication processes on the optical efficiency of replicated Moiré diffraction gratings
    Autorzy:
    Ribeiro, J. E.
    Powiązania:
    https://bibliotekanauki.pl/articles/220824.pdf
    Data publikacji:
    2013
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    diffraction gratings
    Moiré interferometry
    gratings replication
    optical efficiency
    Opis:
    One of the most important parameters in the study of diffraction gratings is their optical efficiency. This paper analyzes the different manufacturing processes to cover gratings of Moiré interferometry and their influence on the quality and absolute efficiency of replicated gratings on the surfaces of specimens. The Moiré interferometry is a field measurement technique that has been used in many different fields such as applied mechanics, microelectronics, biomechanics or micromechanics, hence the importance of this study. The applied reflected coating was done by sputtering and aluminium vaporization processes. In this work different materials and thickness layers were analyzed. The obtained coatings have a high degree of reflectivity on the replicated gratings.
    Źródło:
    Metrology and Measurement Systems; 2013, 20, 1; 119-126
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Compressive optical image encryption using phase-shifting interferometry on a joint transform correlator
    Autorzy:
    Li, J.
    Jia, B.
    Dai, X.
    Lei, M.
    Yang, C.
    Li, H.
    Li, R.
    Powiązania:
    https://bibliotekanauki.pl/articles/174905.pdf
    Data publikacji:
    2017
    Wydawca:
    Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
    Tematy:
    fully optical system
    holographic interferometry
    joint transform correlator (JTC)
    binary scrambling method
    inverse problems
    Opis:
    A compressive optical image encryption method, which combines compressive sensing with phase-shifting interferometry on a joint transform correlator, is proposed in the fully optical domain. The object image is first permutated using a binary scrambling method. Next, the permutated object field is encrypted and registered as the holograms by phase-shifting interferometry on the joint transform correlator setup. Then, the encrypted images and the key are compressed to the compressed data using single-pixel compressive imaging. The original image can be reconstructed and decrypted using the specified algorithm. The simulations demonstrate that the method is effective and suitable for image security transmission.
    Źródło:
    Optica Applicata; 2017, 47, 2; 245-256
    0078-5466
    1899-7015
    Pojawia się w:
    Optica Applicata
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Optyczna interferometria niskokoherentna w diagnostyce powłok ochronnych
    Optical low-coherent interferometry for diagnosis of protective layers
    Autorzy:
    Pluciński, J.
    Strąkowski, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/153664.pdf
    Data publikacji:
    2008
    Wydawca:
    Stowarzyszenie Inżynierów i Techników Mechaników Polskich
    Tematy:
    optyczna interferometria niskokoherentna
    optyczna tomografia koherentna
    powłoka ochronna
    low-coherent interferometry
    optical coherent tomography
    protective layer
    Opis:
    W artykule zaproponowano zastosowanie optycznej interferometrii niskokoherentnej w diagnostyce powłok ochronnych. W badaniach wykorzystano optyczny tomograf koherencyjny wykorzystujący interferometr w konfiguracji Michelsona. W układzie pomiarowym użyto podczerwone źródło promieniowania o krótkiej drodze koherencji, którym był światłowód fotoniczny pobudzany erbowym laserem femtosekundowym. Zastosowano detekcję zrównoważoną niewrażliwą na zmiany polaryzacji przez badany obiekt. Przedstawione wyniki pomiarów pokazały, że można tą techniką diagnozować powłoki ochronne bazujące na farbie zawierającej silnie rozpraszające lub absorbujące pigmenty.
    In this paper, the use of optical low-coherent interferometry for diagnosis of protective layer is proposed. We have used an optical coherent tomography (OCT) system which was based on Michelson interferometer. During our research, a super-continuum infrared light source based on photonic crystal fiber stimulated by a femtosecond erbium-doped laser was used. Balanced and polarization-sensitive detection was employed. Obtained measurement results demonstrate the ability of our system to diagnose high scattering or absorbing protective paint layers by the OCT system.
    Źródło:
    Pomiary Automatyka Kontrola; 2008, R. 54, nr 3, 3; 157-160
    0032-4140
    Pojawia się w:
    Pomiary Automatyka Kontrola
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Analiza topografii powierzchni dyfrakcyjnych elementów optycznych z wykorzystaniem interferometrii światła białego
    Analysis of the surface topography of diffractive optical elements by white light interferometry
    Autorzy:
    Kapłonek, W.
    Tomkowski, R.
    Powiązania:
    https://bibliotekanauki.pl/articles/156402.pdf
    Data publikacji:
    2009
    Wydawca:
    Stowarzyszenie Inżynierów i Techników Mechaników Polskich
    Tematy:
    dyfrakcyjne elementy optyczne
    interferometria światła białego
    topografia powierzchni
    diffractive optical elements
    white light interferometry
    surface topography
    Opis:
    W artykule przedstawiono możliwości oceny i analizy topografii powierzchni dyfrakcyjnych elementów optycznych za pomocą jednej z metod interferometrii światła białego. W badaniach wykorzystano próbkę zawierającą 8 elementów dyfrakcyjnych generujących wzory optyczne o kształtach linii, zbioru linii (poziomych i pionowych) oraz krzyża. Elementy oceniano pod względem geometrii ukształtowania powierzchni za pomocą systemu pomiarowego Talysurf CCI 6000 firmy Taylor Hobson. Zarejestrowane dane pomiarowe analizowano korzystając z oprogramowania Talymap Platinum. Wyniki badań potwierdziły dużą przydatność metody pomiarowej, jak i zastosowanego urządzenia w ocenie tego typu powierzchni posiadających złożoną, wielowarstwową strukturę.
    The paper presents the method based on white light interferometry - SBI (Scanning Broadband Interferometry). SBI uses a correlation algorithm to find the coherence peak and phase position of an interference pattern produced by a selectable bandwidth light source. It provides both high resolution and excellent sensitivity of the returning light. This method can be applied to ultra precision assessment of wide range of surfaces. Measurements of different types of materials, including glass, metal, photo resist, polymer, liquid inks are also possible to be taken. In experimental investigations there was assessed the surface topography of DOEs (Diffractive Optical Elements). A sample containing 8 diffractive optical elements generating optical patterns in the form of single line, multi-lines and crosshair was used for measurements. The surfaces of the all DOEs were measured by an advanced measurement system Talysurf CCI 6000 produced by Taylor Hobson. The measurement data recorded were analysed by Talymap Platinum software. The investigation results confirmed the usefulness both of the measuring method and the applied measurement system for assessment of this type of multilayered surfaces.
    Źródło:
    Pomiary Automatyka Kontrola; 2009, R. 55, nr 4, 4; 272-275
    0032-4140
    Pojawia się w:
    Pomiary Automatyka Kontrola
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Synchronous Measurement of Out-of-Plane Displacement and Slopes by Triple-Optical-Path Digital Speckle Pattern Interferometry
    Autorzy:
    Gu, G.-Q.
    Xu, G.-Z.
    Xu, B.
    Powiązania:
    https://bibliotekanauki.pl/articles/220423.pdf
    Data publikacji:
    2018
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    simultaneous displacement and slopes measurement
    non-destructive testing
    digital speckle pattern interferometry
    shearography
    triple-optical-path
    Opis:
    This study proposes a triple-optical-path digital speckle pattern interferometry (DSPI) setup for measuring the full-field out-of-plane displacement and two orthogonal slopes simultaneously as well as independently. The designed setup contains one conventional out-of-plane speckle interferometer and two orthogonal modified shearographic interferometers with dual-observation geometry. In the setup, one laser device is used as the coherent source, and three monochrome cameras placed along a single line are used as the image acquisition device. Three correlation fringe patterns, one out-of-plane displacement fringe pattern and two slope fringe patterns, are captured synchronously by three cameras, and then are analysed using the phase-shifting technique to extract the phase distributions. The examinations of a practical non-contact measurement and a non-destructive testing (NDT) application by using the proposed setup are carried out in this study.
    Źródło:
    Metrology and Measurement Systems; 2018, 25, 1; 3-14
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    LCoS spatial light modulators as active phase elements of full-field measurement systems and sensors
    Autorzy:
    Kujawinska, M.
    Porras-Aguilar, R.
    Zaperty, W.
    Powiązania:
    https://bibliotekanauki.pl/articles/221745.pdf
    Data publikacji:
    2012
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    spatial light modulators
    liquid crystals on silicon
    phase modulation
    optical metrology
    active interferometry
    active microscopy
    digital holography
    Opis:
    Spatial light modulators (SLM) are devices used to modulate amplitude, phase or polarization of a light wave in space and time. Current SLMs are based either on MEMS (micro-electro-mechanical system) or LCD (liquid crystal display) technology. Here we report on the parameters, trends in development and applications of phase SLMs based on liquid crystal on silicon (LCoS) technology. LCoS technology was developed for front and rear projection systems competing with AMLCD (active matrix LCD) and DMD (Digital Mirror Device) SLM. The reflective arrangement due to silicon backplane allows to put a high number of pixels in a small panel, keeping the fill-factor ratio high even for micron-sized pixels. For coherent photonics applications the most important type of LCoS SLM is a phase modulator. In the paper at first we describe the typical parameters of this device and the methods for its calibration. Later we present a review of applications of phase LCoS SLMs in imaging, metrology and beam manipulation, developed by the authors as well as known from the literature. These include active and adaptive interferometers, a smart holographic camera and holographic display, microscopy modified in illuminating and imaging paths and active sensors.
    Źródło:
    Metrology and Measurement Systems; 2012, 19, 3; 445-458
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    The stress and strain distribution in X10CrMoVNb9-1 power engineering steel after long time degradation studied by the ESPI system
    Autorzy:
    Kopec, Mateusz
    Powiązania:
    https://bibliotekanauki.pl/articles/2173671.pdf
    Data publikacji:
    2022
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    damage
    P91 steel
    electronic speckle pattern interferometry
    ESPI
    optical measurements
    szkoda
    stal P91
    elektroniczna interferometria plamkowa
    pomiar optyczny
    Opis:
    Maintenance of assets and equipment in power plants is essential for their safety and is required to help the plant stay active. In this paper, the specimens manufactured from a pipe of X10CrMoVNb9-1 (P91) power engineering steel in the as-received state and after operating for 80 000 h at internal pressure of 8.4 MPa and temperature of 540ºC were subjected to tests using electronic speckle pattern interferometry (ESPI) under static loading of up to 2.5 kN. Such a procedure enables assessment of strain and stress distribution maps to compare material integrity in the as-received state and after exploitation in its elastic range. The measurements conducted showed no effect of long time operation on the mechanical response of P91 steel under the power installations conditions since the field strain distributions for each type of specimen were found to be similar.
    Źródło:
    Bulletin of the Polish Academy of Sciences. Technical Sciences; 2022, 70, 3; art. no. e141181
    0239-7528
    Pojawia się w:
    Bulletin of the Polish Academy of Sciences. Technical Sciences
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-9 z 9

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