Temat: interference pattern - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Radius measurement of cylindrical surfaces based on analyzing the interference pattern obtained by scanning the surface with focused laser beam
Autorzy:: Jabłoński, R.
Mąkowski, J.
Powiązania:: https://bibliotekanauki.pl/articles/384301.pdf
Data publikacji:: 2009
Wydawca:: Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
Tematy:: radius of curvature
laser diffraction
interference pattern
Opis:: A focused laser beam is incident on the edge of cylindrical object. The reflected edge wave is interfering with geometrical wave forming fringe pattern containing the information about the surface local curvature. This can be determined by analyzing the detector output signal.
Źródło:: Journal of Automation Mobile Robotics and Intelligent Systems; 2009, 3, 4; 37-40
1897-8649
2080-2145
Pojawia się w:: Journal of Automation Mobile Robotics and Intelligent Systems
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: Generation of Large-area Arrays of Aperiodic Functional Micro/nano Structures Using Phase Shift Interferometry
Autorzy:: Pearly Princess, J.
Alfred Kirubaraj, A.
Christina Sophia, S.
Senith, S.
Jino Ramson, S. R.
Powiązania:: https://bibliotekanauki.pl/articles/2055275.pdf
Data publikacji:: 2022
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: laser interference lithography
LIL
pattern structures
periodic patterns
aperiodic patterns
phase shift interferometry
PSI
Opis:: Phase shift interferometry (PSI) derived from interference technique as greater surface characterization technique based on the interference information recorded during a controlled phase shift. This research shows the development of micro/nano structures using phase shift interferometry. (PSI) is the process of developing the complex pattern structure using variable phase angle between two or more beams aligned to obtain functional aperiodic arrays. We have designed and modelled the PSI and simulated through MATLAB in 2D and 3D pattern structures. The PSI was performed in two process analysis. First, without PSI referring normal interference technique. Second, with PSI referring position of laser beams in quadrant-based alignment. The obtained results show the minimum feature structure was measured as 12 nm. This feature size developed under phase shift interferometry (PSI) produces minimum feature size compared to the existing interferometry technique. This study gives the promising increased fabrication area could develop large area arrays structures.
Źródło:: International Journal of Electronics and Telecommunications; 2022, 68, 1; 91--96
2300-1933
Pojawia się w:: International Journal of Electronics and Telecommunications
Dostawca treści:: Biblioteka Nauki

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