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    Wyświetlanie 1-4 z 4
    Tytuł:
    Ionic Conductivity in Multiphase Li₂O-7GeO₂ Compounds
    Autorzy:
    Nesterov, O.
    Trubitsyn, M.
    Nedilko, S.
    Volnianskii, M.
    Plyaka, S.
    Rybak, Ya.
    Powiązania:
    https://bibliotekanauki.pl/articles/1031004.pdf
    Data publikacji:
    2018-04
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.43.-j
    66.10.Ed
    77.84.-s
    68.37.Ps
    Opis:
    Crystallization of Li₂O-7GeO₂ glass was carried out on heating, simultaneously differential scanning calorimetry and electric properties were studied. Morphology of the phase states obtained at glass devitrification was examined by atomic force microscopy. It was shown that amorphous phase of Li₂O-7GeO₂ was crystallized in stages through the intermediate state with increased conductivity σ . In the intermediate state the sample volume was occupied by nanometer-sized nuclei with ordered structure surrounded by internuclear amorphous medium. Complete glass crystallization occurred through transformation of nanometer-sized nuclei into micrometer-sized crystallites and was accompanied by a sharp and irreversible decrease of conductivity. Atomic force microscopy of the samples heat-treated in different ways showed that Li₂O-7GeO₂ glass crystallization was suppressed near the surface and mainly proceeded within the sample bulk. Charge transfer in amorphous, nanocrystalline intermediate and polycrystalline phases of Li₂O-7GeO₂ was associated with motion of the weakly bound Li ions.
    Źródło:
    Acta Physica Polonica A; 2018, 133, 4; 892-896
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Kelvin Force Microscopy Characterization of Corona Charged Dielectric Surfaces
    Autorzy:
    Marinskiy, D.
    Edelman, P.
    Snider, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/1363397.pdf
    Data publikacji:
    2014-04
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    77.55.-g
    73.61.-r
    68.37.Ps
    73.25.+i
    Opis:
    Ionic diffusion of $(H_2O)_{n}^{+}$ and $CO¯_3$ on $SiO_2$ surfaces has been quantified using Kelvin force microscopy measurement of ion distribution change after small spot corona charge. For both positive and negative ionic species, the concentration profiles versus time follow the two-dimensional surface diffusion enabling a determination of corresponding diffusion coefficients. On a thermally grown $SiO_2$ surface, diffusion coefficients of $(H_2O)_{n}^{+}$ and $CO¯_3$ ions were 2.2 × $10^{-11} cm^2$/s and 4.8 × $10^{-12} cm^2$/s, respectively. On a chemically cleaned $SiO_2$ surface, diffusion coefficients of $(H_2O)_{n}^{+}$ and $CO¯_3$ ions were 7.5 × $10^{-9} cm^2$/s and 2.4 × $10^{-9} cm^2$/s, respectively. Mathematical analysis of the surface potential decay yields an additional parameter - capacitance equivalent thickness.
    Źródło:
    Acta Physica Polonica A; 2014, 125, 4; 997-1002
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Advanced Characterization of Material Properties on the Nanometer Scale Using Atomic Force Microscopy
    Autorzy:
    Fenner, M.
    Wu, S.
    Yu, J.
    Huber, H.
    Kienberger, F.
    Powiązania:
    https://bibliotekanauki.pl/articles/1490089.pdf
    Data publikacji:
    2012-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    77.55.-g
    07.79.-v
    68.37.Ps
    68.37.Uv
    07.57.Pt
    Opis:
    We report recent advances in material characterization on the nanometer scale using scanning microwave microscopy. This combines atomic force microscopy and a vector network analyzer using microwave tip sample interaction to characterize dielectric and electronic material properties on the nanometer scale. We present the methods for calibration as well as applications. Scanning microwave microscopy features calibrated measurements of: (1) capacitance with attofarad sensitivity. For calibration a well characterized array of capacitors (0.1 fF to 10 fF) is used. The method is applied to determine the dielectric properties of thin organic films, (2) Semiconductor dopant density. Calibration is performed by imaging the cross-section of a standard sample with differently doped layers (dopant stair case) from $10^{16}$ atoms/$cm^3$ to $10^{20}$ atoms/$cm^3$.
    Źródło:
    Acta Physica Polonica A; 2012, 121, 2; 416-419
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Solid State Ion Exchange Reactions of Co with Zeolites
    Autorzy:
    Jentys, A.
    Lugstein, A.
    Vinek, H.
    Powiązania:
    https://bibliotekanauki.pl/articles/1964135.pdf
    Data publikacji:
    1997-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    77.84.Bw
    82.65.Jv
    71.20.Be
    81.20.Fw
    61.10.Ht
    71.20.Ps
    Opis:
    Co cations were introduced into ZSM5 and faujasite type zeolites by solid state ion exchange. On both types of zeolites the solid state reaction led to an exchange of all protons. On ZSM5 one proton was exchanged with one Co$\text{}^{2+}$ cation, while on the faujasite samples two protons were exchanged with one Co$\text{}^{2+}$ cation. After the incorporation of cobalt two new Lewis acid sites were observed on the CoZSM5 and CoY samples.
    Źródło:
    Acta Physica Polonica A; 1997, 91, 5; 969-974
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-4 z 4

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