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Wyświetlanie 1-4 z 4
Tytuł:
Microscopic Analysis of the Aluminium Castings Produced with the use of Polymer Composite Patterns
Autorzy:
Czarnecka-Komorowska, Dorota
Gawdzińska, Katarzyna
Popielarski, Paweł
Powiązania:
https://bibliotekanauki.pl/articles/2174630.pdf
Data publikacji:
2022
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
aluminium castings
lost wax method
bentonite
microscopic analysis
polymer composites
odlewy aluminiowe
metoda wosku traconego
bentonit
analiza mikroskopowa
kompozyty polimerowe
Opis:
The paper presents a microscopic analysis of the surface and fracture of aluminium castings produced using the lost-wax method for patterns made of a composite material, i.e. polyethylene with the addition of bentonite. Castings are made of AlSi7 aluminium alloy (silumin) in a plaster mould. A new type of polymer waxes enriched with bentonite was used to obtain new composites, minimizing the defects caused by the casting production process. The castings were made in the centrifugal casting process. The prepared plaster moulds were removed from the furnace and poured with liquid aluminium alloy (AlSi7) at 750°C. The surface and fracture of the castings was analysed using an optical digital microscope type VHX-7000 manufactured by KEYENCE. It has been proven that the studied castings feature surface defects (raw surface defects) in the form of high roughness and the presence of bentonite inclusions classified as casting contamination. During the tests, shape defects related to mechanical damage were also.
Źródło:
Archives of Foundry Engineering; 2022, 22, 3; 113--117
1897-3310
2299-2944
Pojawia się w:
Archives of Foundry Engineering
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Application of instance-based learning for cast iron casting defects prediction
Autorzy:
Sika, Robert
Szajewski, Damian
Hajkowski, Jakub
Popielarski, Paweł
Powiązania:
https://bibliotekanauki.pl/articles/407199.pdf
Data publikacji:
2019
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
soft modelling
instance-based learning
k-nearest neighbours algorithm
cast iron casting defects
computer application
Opis:
The paper presents an example of Instance-Based Learning using a supervised classification method of predicting selected ductile cast iron castings defects. The test used the algorithm of k-nearest neighbours, which was implemented in the authors’ computer application. To ensure its proper work it is necessary to have historical data of casting parameter values registered during casting processes in a foundry (mould sand, pouring process, chemical composition) as well as the percentage share of defective castings (unrepairable casting defects). The result of an algorithm is a report with five most possible scenarios in terms of occurrence of a cast iron casting defects and their quantity and occurrence percentage in the casts series. During the algorithm testing, weights were adjusted for independent variables involved in the dependent variables learning process. The algorithms used to process numerous data sets should be characterized by high efficiency, which should be a priority when designing applications to be implemented in industry. As it turns out in the presented mathematical instance-based learning, the best quality of fit occurs for specific values of accepted weights (set #5) for number k = 5 nearest neighbours and taking into account the search criterion according to “product index”.
Źródło:
Management and Production Engineering Review; 2019, 10, 4; 101-107
2080-8208
2082-1344
Pojawia się w:
Management and Production Engineering Review
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Structural, morphological and photoluminescent properties of annealed ZnO thin layers obtained by the rapid sol-gel spin-coating method
Autorzy:
Sypniewska, Małgorzata
Szczesny, Robert
Popielarski, Paweł
Strzałkowski, Karol
Derkowska-Zielinska, Beata
Powiązania:
https://bibliotekanauki.pl/articles/1818231.pdf
Data publikacji:
2020
Wydawca:
Polska Akademia Nauk. Stowarzyszenie Elektryków Polskich
Tematy:
FTIR and Raman spectroscopies
photoluminescence
SEM
XRD
ZnO thin films
Opis:
ZnO thin layers were deposited on p-type silicon substrates by the sol-gel spin-coating method and, then, annealed at various temperatures in the range of 573-873 K. Photoluminescence was carried out in the temperature range of 20-300 K. All samples showed two dominant peaks that have UV emissions from 300 nm to 400 nm and visible emissions from 400 nm to 800 nm. Influence of temperature on morphology and chemical composition of fabricated thin layers was examined by XRD, SEM, FTIR, and Raman spectroscopy. These measurements indicate that ZnO structure is obtained for samples annealed at temperatures above 573 K. It means that below this temperature, the obtained thin films are not pure zinc oxide. Thus, annealing temperature significantly affected crystallinity of the thin films.
Źródło:
Opto-Electronics Review; 2020, 28, 4; 182--190
1230-3402
Pojawia się w:
Opto-Electronics Review
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Structural, morphological and photoluminescent properties of annealed ZnO thin layers obtained by the rapid sol-gel spin-coating method
Autorzy:
Sypniewska, Małgorzata
Szczesny, Robert
Popielarski, Paweł
Strzalkowski, Karol
Derkowska-Zielinska, Beata
Powiązania:
https://bibliotekanauki.pl/articles/1818237.pdf
Data publikacji:
2020
Wydawca:
Polska Akademia Nauk. Stowarzyszenie Elektryków Polskich
Tematy:
FTIR and Raman spectroscopies
photoluminescence
SEM
XRD
ZnO thin films
Opis:
ZnO thin layers were deposited on p-type silicon substrates by the sol-gel spin-coating method and, then, annealed at various temperatures in the range of 573-873 K. Photoluminescence was carried out in the temperature range of 20-300 K. All samples showed two dominant peaks that have UV emissions from 300 nm to 400 nm and visible emissions from 400 nm to 800 nm. Influence of temperature on morphology and chemical composition of fabricated thin layers was examined by XRD, SEM, FTIR, and Raman spectroscopy. These measurements indicate that ZnO structure is obtained for samples annealed at temperatures above 573 K. It means that below this temperature, the obtained thin films are not pure zinc oxide. Thus, annealing temperature significantly affected crystallinity of the thin films.
Źródło:
Opto-Electronics Review; 2020, 28, 4; 182--190
1230-3402
Pojawia się w:
Opto-Electronics Review
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

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