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Tytuł:
Bioimaging with 4th Generation X-Ray Sources
Autorzy:
Pełka, J.
Powiązania:
https://bibliotekanauki.pl/articles/1809941.pdf
Data publikacji:
2009-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
87.59.-e
41.60.Cr
07.85.Qe
82.53.Ps
87.64.Bx
Opis:
Newly constructed 4th generation sources of intense synchrotron radiation in ultrafast pulses of only 10-50 fs and wavelengths up to X-rays, the free electron lasers, are expected to revolutionize development of biological science. To take full advantage of unique properties of the sources, new imaging techniques of molecular and microscopic biological objects are developed. Present article provides a short review of a stormy development of bioimaging with incoming soon 4th generation synchrotron radiation X-ray sources. Some implications for the future of new sources and techniques are discussed as well.
Źródło:
Acta Physica Polonica A; 2009, 115, 2; 572-575
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Synchrotron Radiation in Biology and Medicine
Autorzy:
Pełka, J.
Powiązania:
https://bibliotekanauki.pl/articles/1812240.pdf
Data publikacji:
2008-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
87.57.-s
87.59.-e
07.85.Fv
07.90.+c
Opis:
This work is focused on a present status of synchrotron radiation X-ray applications in medicine and biology to imaging, diagnostics, and radiotherapy. Properties of X-ray beams generated by synchrotron sources are compared with radiation produced by classical laboratory X-ray tubes. A list of operating and planned synchrotron facilities applicable to biomedical purposes is given, together with their basic characteristics. A concise overview of typical X-ray synchrotron techniques in biology and medicine is carried out with discussion of their specific properties and examples of typical results.
Źródło:
Acta Physica Polonica A; 2008, 114, 2; 309-329
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Study of Instrumental Factors Affecting X-Ray Isochromat Spectra
Autorzy:
Pełka, J. B.
Powiązania:
https://bibliotekanauki.pl/articles/1931722.pdf
Data publikacji:
1994-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
07.85.+n
06.90.+v
Opis:
In the present paper a model of an apparatus function for the bremsstrahlung isochromat spectroscopy method is proposed. The study presented in this work is based on experimental results obtained with a particular spectrometer working at the quantum energy of Cr K$\text{}_{α1}$ (5414 eV). However, most of implications are general for the bremsstrahlung isochromat spectroscopy independently of particular construction of a spectrometer. From the theoretical considerations it was found that the total apparatus function, F$\text{}_{t}$, is composed of two main subfunctions in such a manner that F$\text{}_{t}$ is not necessarily constant along the isochromat spectrum. The properties of the function as well as the question how it influences the measured spectra are discussed. Considerations presented in this paper are limited to the most essential instrumental factors broadening the bremsstrahlung isochromat spectra which can be described in terms of the apparatus function. In order to estimate the width of the apparatus function some experimental results of bremsstrahlung isochromat spectroscopy measurements of chosen substances with various apparatus settings are shown.
Źródło:
Acta Physica Polonica A; 1994, 86, 5; 753-762
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-Ray Standing Wave Technique as a Tool in the Study of the Imperfect Crystals
Autorzy:
Pełka, J.
Auleytner, J.
Powiązania:
https://bibliotekanauki.pl/articles/1920851.pdf
Data publikacji:
1992-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.-i
Opis:
The application of the X-ray standing wave (XSW) technique in the case of imperfect crystals meets serious theoretical and interpretational problems. However, well-known advantages of the XSW technique make it especially interesting to the study of the ordering of impurities and of various processes leading to changes in this ordering in various likes of imperfect crystals. In this work we try to answer the question how imperfection of a crystal may influence the changes in fluorescence yield during the XSW measurement. Two likes of imperfect crystals are studied: Si(111) implanted with high energetic Bi$\text{}^{+}$ ions, and Zn$\text{}_{1-x}$Co$\text{}_{x}$Se single crystal with natural (111) face. The discussion of obtained results shows that general features of the X-ray standing wave field are conserved despite the considerable imperfections of the crystals. The results seem to support the applicability of the XSW technique to the study of imperfect materials, although some further theoretical effort would be required.
Źródło:
Acta Physica Polonica A; 1992, 82, 1; 163-171
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effective Velocity of Soliton in the Presence of a Periodic Background
Autorzy:
Pełka, J.
Zagrodziński, J.
Powiązania:
https://bibliotekanauki.pl/articles/2029259.pdf
Data publikacji:
2001-12
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
42.50.Md
42.81.Dp
74.50.+r
85.25.Cp
Opis:
The effective soliton velocity in the presence of a periodic background differs from that when a soliton propagates alone. Using approximate relations for the Riemann-theta functions, the effective soliton velocity is derived and discussed. General relations are illustrated by examples of Korteweg de Vries and sine-Gordon equations because of the application in the Josephson junction theory.
Źródło:
Acta Physica Polonica A; 2001, 100, 6; 871-877
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Metrological Applications of X-ray Waveguide Thin Film Structures in X-ray Reflectometry and Diffraction
Autorzy:
Pełka, J. B.
Lagomarsino, S.
Powiązania:
https://bibliotekanauki.pl/articles/2035489.pdf
Data publikacji:
2002-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.65.-k
61.10.Kw
06.30.Bp
Opis:
The effect of resonance, observed in X-ray waveguide layered structures in a characteristic way influences the scattering properties of the films. It is well known that in the resonant region the reflectivity shows a series of minima, usually very deep and extremely narrow. The positions and depths of the minima depend only on X-ray waveguide structural properties, on the X-ray wavelength and on the incident beam divergence. In the present work we propose and discuss the application of the X-ray waveguide and quasi X-ray waveguide film structures as tools to experimental evaluation of some quantities related to X-ray reflectometric or diffractometric measurements, like the beam divergence, wavelength, or angular distance. Examples of application of the X-ray waveguide as an excellent tool to estimate the effective beam divergence are shown. Properties of the X-ray waveguide elements as a handy wavelength or angular calibration standard are also mentioned.
Źródło:
Acta Physica Polonica A; 2002, 102, 2; 233-238
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Applications of Free Electron Lasers in Biology and Medicine
Autorzy:
Pełka, J.
Tybor, K.
Nietubyć, R.
Wrochna, G.
Powiązania:
https://bibliotekanauki.pl/articles/1539156.pdf
Data publikacji:
2010-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
87.59.-e
41.60.Cr
07.85.Qe
82.53.Ps
87.64.Bx
Opis:
The advent of free electron lasers opens up new opportunities to probe the dynamics of ultrafast processes and the structure of matter with unprecedented spatial and temporal resolution. New methods inaccessible with other known types of radiation sources can be developed, resulting in a breakthrough in deep understanding the fundamentals of life as well as in numerous medical and biological applications. In the present work the properties of free electron laser radiation that make the sources excellent for probing biological matter at an arbitrary wavelength, in a wide range of intensities and pulse durations are briefly discussed. A number of biophysical and biomedical applications of the new sources, currently considered among the most promising in the field, are presented.
Źródło:
Acta Physica Polonica A; 2010, 117, 2; 427-432
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-Ray and Electron-Optical Characterization of ZnTe/CdTe and ZnTe/GaAs Epitaxial Layers Obtained by the MBE Method
Autorzy:
Auleytner, J.
Dziuba, Z.
Górecka, J.
Pełka, J.
Regiński, K.
Powiązania:
https://bibliotekanauki.pl/articles/1931657.pdf
Data publikacji:
1994-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.14.Hg
61.10.-i
68.55.-a
Opis:
X-ray diffraction topography (Bragg diffraction) and X-ray rocking curve measurements were used to study the perfection and structural properties of ZnTe epitaxial layers on the CdTe and GaAs substrates. ZnTe epitaxial layers on CdTe were grown by MBE method by using a machine made in the Institute of Physics of the Polish Academy of Sciences. The ZnTe layers on GaAs were produced on the other, factory-made MBE system. The comparison between the X-ray topographical images of the substrate and epitaxial layer shows that imperfections on the substrate surface cause imperfections in the epitaxial layer. The results of double-crystal diffractometry measurements show that the perfection of the layer on the GaAs substrate is higher than that on the CdTe. The presence of microtwining in the ZnTe layer on the CdTe substrate was confirmed by RHEED measurements. The X-ray standing wave fluorescent spectra were also measured for the samples.
Źródło:
Acta Physica Polonica A; 1994, 86, 4; 567-574
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Grazing Incidence X-Ray Reflectivity Study of MBE-Grown Co/Cu Multilayers
Autorzy:
Pełka, J. B.
Baczewski, L. T.
Wawro, A.
Domagała, J.
Powiązania:
https://bibliotekanauki.pl/articles/1963397.pdf
Data publikacji:
1997-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
75.30.Gw
75.30.-m
75.70.-i
Opis:
In this work we report preliminary grazing-incidence X-ray reflectometry studies of multilayer structures composed of 3d metals Co and Cu deposited in the ultra-high vacuum molecular beam epitaxy system. The multilayers of different modulation period were deposited on glass substrate directly, or on 3d -metallic buffers of various thicknesses. The experimental specular reflectivity spectra were analyzed by a comparison with a theoretical model calculated from a recursive algorithm based on the Fresnel formula [1, 2]. It enabled us to estimate the structural parameters concerning layer thickness and roughness. The results obtained are correlated with magnetization measurements of the layered structures, as a function of modulation period, buffer type and thickness. A special attention to influence of interfacial roughness on magnetization results is paid.
Źródło:
Acta Physica Polonica A; 1997, 91, 5; 859-863
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Lattice Parameters of Aluminium Nitride in the Range 10-291 K
Autorzy:
Paszkowicz, W.
Knapp, M.
Podsiadło, S.
Kamler, G.
Pełka, J. B.
Powiązania:
https://bibliotekanauki.pl/articles/2030706.pdf
Data publikacji:
2002-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
81.05.Je
65.40.De
65.60.+a
65.40.-b
Opis:
Lattice parameters for aluminium nitride were determined using X-ray powder diffraction at a synchrotron radiation source (beamline B2, Hasylab/DESY, Hamburg) in the temperature range from 10 K to 291 K. The measurements were carried out using the Debye-Scherrer geometry. The relative change of both, a and c, on rising the temperature in the studied range (10-291 K) is about 0.03%. The results are compared with earlier laboratory data and theoretical predictions.
Źródło:
Acta Physica Polonica A; 2002, 101, 5; 781-785
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Study of Si(111) Implanted with As Ions by X-Ray Diffraction and Grazing Incidence Methods
Autorzy:
Pełka, J. B.
Górecka, J.
Auleytner, J.
Domagała, J.
Bąk-Misiuk, J.
Powiązania:
https://bibliotekanauki.pl/articles/1964119.pdf
Data publikacji:
1997-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.55.Ln
68.55.Jk
Opis:
The Si(111) wafer cut from a bulk single crystal obtained by the Czochralski method was implanted with 5×10$\text{}^{16}$ I cm$\text{}^{-2}$ of As ions of energy 80 keV. The dose applied was chosen above the amorphization limit of the silicon substrate. Two samples, implanted and a reference, were studied by grazing incidence X-ray reflectometry and X-ray diffraction methods using a high resolution Philips MRD system equipped with a Cu source and a channel-cut monochromator. The obtained spectra were compared with distributions of ion range and defect production calculated with TRIM program [1], as well as with theoretical models of reflectivity [2, 3]. The results of grazing incidence X-ray reflectometry reflectivity of the implanted sample show well-pronounced oscillations, which can be associated with a layer about 50 nm thick, approximately comparable to the thickness of the defected layer estimated from the TRIM method. Theoretical calculations of reflectivity clearly indicate an occurrence of a Si layer of electron density lower about 10-15% comparing to the unimplanted Si sample. This can be due to the vacancy production during ion implantation. A comparison of the spectra with a density distribution profile concluded from the TRIM calculations shows large discrepancies. The results indicate the applicability of grazing incidence X-ray reflectometry method in a study of amorphization processes in implanted layers.
Źródło:
Acta Physica Polonica A; 1997, 91, 5; 905-910
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-Ray and Electron-Optical Characterization of ZnSe(Co) Crystal with Natural Face
Autorzy:
Auleytner, J.
Domagała, J.
Gołacki, Z.
Pawłowska, M.
Pełka, J.
Regiński, K.
Powiązania:
https://bibliotekanauki.pl/articles/1929340.pdf
Data publikacji:
1993-06
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.-i
61.14.Hg
61.16.Bg
Opis:
Using complementary X-ray and electron-optical methods, a ZnSe(Co) crystal with natural face was investigated. X-ray diffraction methods such as double-crystal X-ray reflection topography, double-crystal diffractometry for rocking curve measurements, precise lattice constant measurements by the Bond technique were used for crystal structure characterization and X-ray fluorescence method for studies of chemical composition along the crystal. The scanning electron microscopic image of the crystal surface and reflection diffraction of the high-energy electrons enriched the crystal structure characterization. It was shown that X-ray characterization and reflection high-energy electron diffraction can be regarded as very important complementary tools for non-destructive investigation of the ZnSe(Co) crystal surface layers.
Źródło:
Acta Physica Polonica A; 1993, 83, 6; 759-768
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Oscillations in Reflectivity of Samples with X-ray Waveguide Layers
Autorzy:
Pełka, J. B.
Lagomarsino, S.
Di Fonzo, S.
Jark, W.
Domagała, J.
Powiązania:
https://bibliotekanauki.pl/articles/1945221.pdf
Data publikacji:
1996-03
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.65.+g
78.20.Ci
Opis:
The glancing-angle reflectivity profiles in samples containing an X-ray waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discussion is extended to the structures composed of more than one layer. Experimental reflectivity spectra recorded with Cu K$\text{}_{α}$ radiation are compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non-resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applications of the reflectivity spectra to the studies of structure of thin layers is done.
Źródło:
Acta Physica Polonica A; 1996, 89, 3; 323-328
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Study of Photoelectron Emission Yield from Layered Structures in Presence of Resonance-Enhanced X-Ray Propagation Effect
Autorzy:
Pełka, J. B.
Lagomarsino, S.
Cedola, A.
Di Fonzo, S.
Jark, W.
Powiązania:
https://bibliotekanauki.pl/articles/1963396.pdf
Data publikacji:
1997-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.65.+g
78.20.-e
Opis:
In this work we present the new experimental results of total photoelectric yield as well as energy distribution of photoelectrons excited in a thin carbon film deposited on Ni mirror in the presence of resonance-enhanced X-ray propagation effect. The measurements were performed using conventional X-ray tube as a radiation source for the energy Cu K$\text{}_{α}$ (8047 keV). The spectra were recorded using a flow proportional electron counter with energy resolution of about 15%, and multichannel pulse height analyzer. A comparison with the reflectivity spectra recorded at the same time show an excellent correlation of both kinds of spectra, consistently with the theoretical prediction. A map of electron energy distribution is reported. Although the applied electron counter was of low energetic resolution the recorded spectra show characteristic regularities and indicate that the photoelectron yield excited in the presence of resonance-enhanced X-ray propagation effect can provide depth dependent information about impurity distribution and processes in thin layers.
Źródło:
Acta Physica Polonica A; 1997, 91, 5; 851-857
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Structure and Magnetism of MBE-Grown Co/Cu Multilayers
Autorzy:
Baczewski, L. T.
Wawro, A.
Domagała, J.
Pełka, J.
Szewczyk, A.
Nabiałek, A.
Powiązania:
https://bibliotekanauki.pl/articles/1955475.pdf
Data publikacji:
1997-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
75.30.Gw
75.30.-m
75.70.-i
Opis:
Structural and magnetic properties of Co/Cu multilayers deposited in the ultra-high vacuum molecular beam epitaxy system on glass substrates with different modulations periods were investigated. A structural characterization was performed by means of RHEED and Auger spectroscopy (in situ), small angle X-ray reflectivity and scanning tunneling microscopy. The samples obtained have a textured, polycrystalline layered structure for deposition at room temperature. Magnetization and in-plane magnetoresistance measurements were performed as a function of Cu and Co layer thicknesses. An influence of different buffers and of interface quality on magnetic properties was investigated.
Źródło:
Acta Physica Polonica A; 1997, 91, 2; 315-319
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Wyświetlanie 1-15 z 22

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