- Tytuł:
- Oscillations in Reflectivity of Samples with X-ray Waveguide Layers
- Autorzy:
-
Pełka, J. B.
Lagomarsino, S.
Di Fonzo, S.
Jark, W.
Domagała, J. - Powiązania:
- https://bibliotekanauki.pl/articles/1945221.pdf
- Data publikacji:
- 1996-03
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
68.65.+g
78.20.Ci - Opis:
- The glancing-angle reflectivity profiles in samples containing an X-ray waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discussion is extended to the structures composed of more than one layer. Experimental reflectivity spectra recorded with Cu K$\text{}_{α}$ radiation are compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non-resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applications of the reflectivity spectra to the studies of structure of thin layers is done.
- Źródło:
-
Acta Physica Polonica A; 1996, 89, 3; 323-328
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł