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Wyszukujesz frazę "Habubi, N. F." wg kryterium: Autor


Wyświetlanie 1-8 z 8
Tytuł:
Effect of annealing temperature on the optical properties of ZnO nanoparticles
Autorzy:
Ismail, R. A.
Habubi, N. F.
Abid, H. R.
Powiązania:
https://bibliotekanauki.pl/articles/412203.pdf
Data publikacji:
2014
Wydawca:
Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:
nanoparticles
ZnO film
optical properties
drop casting technique
Opis:
In this work, ZnO films were prepared by drop casting technique. The films were deposited on quartz substrates under different annealing time (15,30,45 and 60 min.) at a constant temperature (800 °C). The optical properties were achieved by measuring the absorbance and transmittance spectra in the wavelength range (200-900) nm. It was found that the absorbance decreases while transmission increases as the annealing time increases, while the reflectance decreases as the annealing time increases. The optical measurements indicate the kind of transition which was a direct allowed with an average band gap energies lie between 3.3 eV and 3.54 eV with the change of annealing time.
Źródło:
International Letters of Chemistry, Physics and Astronomy; 2014, 4; 37-47
2299-3843
Pojawia się w:
International Letters of Chemistry, Physics and Astronomy
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Optical and Dispersion parameters of ZnS Thin Films Prepared by Flash Evaporation Method
Autorzy:
Bakr, N. A.
Jandow, N. N.
Habubi, N. F.
Powiązania:
https://bibliotekanauki.pl/articles/412057.pdf
Data publikacji:
2014
Wydawca:
Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:
ZnS thin film
flash evaporation
Swanepoel technique
single oscillator model
Opis:
Zns thin films are obtained by flash evaporation method onto preheated glass substrates. The transmittance analysis allowed the determination of refractive index and thickness using envelope method. It was found that the refractive dispersion data obeyed the single oscillator model. The calculated value of the refractive index (n0 ) was found to be equal to 2.27, which is in a good agreement with the value obtained from Cauchy’s fitting. Also the value of the optical energy gap, extinction coefficient, real and imaginary parts of the dielectric constant and optical conductivity have been measured.
Źródło:
International Letters of Chemistry, Physics and Astronomy; 2014, 20, 1; 52-63
2299-3843
Pojawia się w:
International Letters of Chemistry, Physics and Astronomy
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Fabrication and characterization of porous silicon layer prepared by photo-electrochemical etching in CH3OH:HF solution
Autorzy:
Hadi, H.A.
Ismail, R.A.
Habubi, N.F.
Powiązania:
https://bibliotekanauki.pl/articles/412262.pdf
Data publikacji:
2013
Wydawca:
Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:
porous silicon
photo-electrochemical etching (PECE)
porosity
thickness
XRD
AFM
Opis:
Porous silicon (PS) has been fabricated by Photo-electrochemical etching. Porous silicon was anodized on n-type Si in light using a current density of 20mA/cm2 for 10 min. The porous structure formation was confirmed using XRD and AFM studies. The root mean square (RMS) roughness of the Porous silicon layer is found to be around 47.5 nm and the ten point height was 317 nm. The average of pores diameter was 419.98nm, and the grain growth is columnar with a (211) preferred orientation. The grain size of the PS was estimated from the Scherer's formula and found to be 73 nm. All the properties of the porous silicon layer, such as porosity and the thickness depend on the anodization parameters. The porosity (P) was approximately 77 %. The thickness of the layer formed during an anodization in constant current was 3.54nm in gravimetric method, while its value was 1.77nm by using the theoretical relation.
Źródło:
International Letters of Chemistry, Physics and Astronomy; 2013, 3; 29-36
2299-3843
Pojawia się w:
International Letters of Chemistry, Physics and Astronomy
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Optical dispersion characterization of sprayed Zn1-xMnxO thin films
Autorzy:
Habubi, N.F.
Chiad, S.S.
Oboudi, S.F.
Toma, Z.A.
Powiązania:
https://bibliotekanauki.pl/articles/411575.pdf
Data publikacji:
2013
Wydawca:
Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:
TCOs
Dispersion parameters
spray pyrolysis
zinc oxide
Zn1-xMnxO
Opis:
Uniform and adherent Zn1-xMnxO films have been deposited by using spray pyrolysis technique on glass substrates. The optical properties and dispersion parameters of zinc oxide have been studied as a function of doping concentration with Mn. Changes in direct optical energy band gap of cobalt oxide films were confirmed after doping, The optical energy gap Eg increased from 3.13 eV for the undoped ZnO to 3.39 eV with increasing the doping concentration of Mn to 4%. The changes in dispersion parameters and Urbach tails were investigated. An increase in the doping concentration causes a decrease in the average oscillator strength. The single-oscillator parameter has been reported.
Źródło:
International Letters of Chemistry, Physics and Astronomy; 2013, 4; 1-8
2299-3843
Pojawia się w:
International Letters of Chemistry, Physics and Astronomy
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of Gamma Irradiation on the Optical Properties of Mg doped CdO Thin films deposited by Spray Pyrolysis
Autorzy:
Hassouni, M.H.
Mishjil, K.A.
Chiad, S.S.
Habubi, N.F.
Powiązania:
https://bibliotekanauki.pl/articles/412503.pdf
Data publikacji:
2013
Wydawca:
Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:
TCOs
thin films
optical properties
doping film
gamma radiation
Opis:
Thin films of CdO and 9 % Mg doped CdO doped have been prepared using spray pyrolysis technique. Transmission and absorption spectra were recorded in order to estimate these films. The deposited thin films were exposed to γ - rays. We have studied the transmission, absorptions and absorption coefficient as a function of photon energy before and after irradiation. The optical constants such as: reflectance, extinction coefficient, refractive index, real and imaginary parts of the dielectric constant and the electrical conductivity were calculated also.
Źródło:
International Letters of Chemistry, Physics and Astronomy; 2013, 11; 26-37
2299-3843
Pojawia się w:
International Letters of Chemistry, Physics and Astronomy
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Composition and Optical Dispersion Characterization of Nanoparticles ZnO-NiO Thin Films: Effect of Annealing Temperature
Autorzy:
Oboudi, S.F.
Habubi, N.F.
Mohamed, G.H.
Chiad, S.S.
Powiązania:
https://bibliotekanauki.pl/articles/412573.pdf
Data publikacji:
2013
Wydawca:
Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:
TCOs
Dispersion parameters
Thermal evaporation
zinc oxide
Nickel Oxide
Opis:
Thin films of ZnO0.7NiO0.3 have deposited on glass substrates at room temperature by using thermal evaporation technique under vacuum 10-5 mbar. The optical properties and dispersion parameters of the films have been studied. Changes in direct optical energy band gap of films were confirmed before and after annealing. The optical energy gap Eg decreased from 3.11 to 2.86 eV with increasing of annealing temperature to 200 ºC. Some of the optical absorption parameters, such as optical dispersion energies Eo and Ed, Urbach tails EU , dielectric constant ε, the average values of oscillator strength So, and wavelength of single oscillator λo have been reported. An increase in the annealing temperature causes an increase in the average oscillator strength from 62.02 to 87.71 eV.
Źródło:
International Letters of Chemistry, Physics and Astronomy; 2013, 8, 1; 78-86
2299-3843
Pojawia się w:
International Letters of Chemistry, Physics and Astronomy
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Metal-titanium oxide / quantum dot porous silicon / silicon-metal solar cell
Autorzy:
Abd, Ahmad Naji
Mishjil, Khudheir A.
Abdulsada, Ali Hamid
Habubi, N. F.
Powiązania:
https://bibliotekanauki.pl/articles/1177996.pdf
Data publikacji:
2018
Wydawca:
Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:
AFM
FTIR
TiO2
X-Ray diffraction
XRD
electrochemical etching p-type silicon wafer
nanocrystalline porous silicon
Opis:
In this paper, the nanocrystalline porous silicon (PSi) films are prepared by electrochemical etching of p-type silicon wafer with current density 7 mA/cm2 and etching times on the formation nano-sized pore array with a dimension of around different etching time. The films were characterized by the measurement of XRD, FTIR spectroscopy and atomic force microscopy properties (AFM). We have estimated crystallites size from X-Ray diffraction about nanoscale for porous silicon and Atomic Force microscopy confirms the nanometric size Chemical fictionalization during the electrochemical etching show on the surface chemical composition of PS. The etching possesses inhomogeneous microstructures that contain a-Si clusters (Si3–Si–H) dispersed in amorphous silica matrix. From the FTIR analyses showed that the Si dangling bonds of the as-prepared PS layer have large amount of Hydrogen to form weak Si–H bonds. The atomic force microscopy investigation shows the rough silicon surface, with increasing etching process (current density and etching time) porous structure nucleates which leads to an increase in the depth and width (diameter) of surface pits. Consequently, the surface roughness also increase.
Źródło:
World Scientific News; 2018, 96; 134-148
2392-2192
Pojawia się w:
World Scientific News
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of molarity on the structural and optical properties of ZnO thin films deposit by CSP
Autorzy:
Habubi, Nadir F.
Abood, Ziad M.
Algamel, Ahmed N.
Powiązania:
https://bibliotekanauki.pl/articles/1193915.pdf
Data publikacji:
2015
Wydawca:
Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:
Urbach energy
ZnO
ZnO thin films
optical properties
structural properties
Opis:
ZnO thin films have been prepared by chemical spray pyrolysis technique CSP). XRD pattern reveals that the preferred orientation was varied with concentration, topography analysis was done by AFM micrograph which confirm the existence of nonstructural films. The optical properties was done by recorded the transmittane and absorbance which were affected by an increase in concentration. The values of optical energy gap obtained from Tauc relation were 3.17, 3.18 and 3.19 eV for 0.05, 0.1 and 0.5 M respectively. Urbach energy confirms the decrease in band tail as the concentration increase.
Źródło:
World Scientific News; 2015, 22; 55-69
2392-2192
Pojawia się w:
World Scientific News
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-8 z 8

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