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Wyszukujesz frazę "Grabiński, W." wg kryterium: Autor


Wyświetlanie 1-4 z 4
Tytuł:
Compact modeling of low-power and RF analogue MOSFET devices
Autorzy:
Grabiński, W.
Powiązania:
https://bibliotekanauki.pl/articles/378393.pdf
Data publikacji:
2003
Wydawca:
Sieć Badawcza Łukasiewicz - Instytut Technologii Elektronowej
Opis:
The technology of CMOS very large-scale integrated circuits (VLSI's) achieved remarkable advances over the last 25 years and the progress is expected to continue well into this century. The progress has been driven by the downsizing of the key devices: MOSFETs. Approaching these dimensions, MOSFET characteristics cannot be accurately predicted using classical modeling methods currently used in the most common MOSFET models such as BSIM3/4, EKV v2.6, HiMOS, MOS9 etc., without introducing large number of empirical parameters. Various physical effects that are needed to be considered while modeling UDSM devices: quantization of the inversion layer, mobility degradation, carrier velocity saturation and overshoot, polydepletion effects, bias dependent source/drain resistances and capacitances, vertical and lateral doping profiles, etc. In this paper, we will discuss the progress in CMOS technology and anticipated difficulties of the sub-O.25 um VLSI downsizing. Subsequently, basic MOSFET modeling methodologies that are more appropriate for low power and RF analogue applications of UDSM MOSFETs will be presented as well.
Źródło:
Electron Technology : Internet Journal; 2003, 35, 2; 1-7
1897-2381
Pojawia się w:
Electron Technology : Internet Journal
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Compact device modeling using Verilog-AMS and ADMS
Autorzy:
Lemaitre, L.
Grabiński, W.
McAndrew, C.
Powiązania:
https://bibliotekanauki.pl/articles/378395.pdf
Data publikacji:
2003
Wydawca:
Sieć Badawcza Łukasiewicz - Instytut Technologii Elektronowej
Opis:
This paper shows how high level language such as Verilog-AMS can serve as support for compact modeling development of new devices. First section gives a fulI Verilog-AMS code of a simplified bipolar transistor. Each part of the code is carefulIy examined and explained. Second section compares different implementations of the simplified bipolar transistor in different spice simulators. ADMS, an open-source tool developed at Motorola, performs the implementation from Verilog-AMS to simulators. Third section concludes the paper by describing the implementation of the EKV model into ADS using the compact model interface provided by Agilent.
Źródło:
Electron Technology : Internet Journal; 2003, 35, 3; 1-5
1897-2381
Pojawia się w:
Electron Technology : Internet Journal
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Standardization of the compact model coding: non-fully depleted SOI MOSFET example
Autorzy:
Grabiński, W.
Tomaszewski, D.
Lemaitre, L.
Jakubowski, A.
Powiązania:
https://bibliotekanauki.pl/articles/308862.pdf
Data publikacji:
2005
Wydawca:
Instytut Łączności - Państwowy Instytut Badawczy
Tematy:
Verilog-AMS
compact model coding
SOI MOSFET
Opis:
The initiative to standardize compact (SPICE-like) modelling has recently gained momentum in the semiconductor industry. Some of the important issues of the compact modelling must be addressed, such as accuracy, testing, availability, version control, verification and validation. Most compact models developed in the past did not account for these key issues which are of highest importance when introducing a new compact model to the semiconductor industry in particular going beyond the ITRS roadmap technological 100 nm node. An important application for non-fully depleted SOI technology is high performance microprocessors, other high speed logic chips, as well as analogue RF circuits. The IC design process requires a compact model that describes in detail the electrical characteristics of SOI MOSFET transistors. In this paper a non-fully depleted SOI MOSFET model and its Verilog-AMS description will be presented.
Źródło:
Journal of Telecommunications and Information Technology; 2005, 1; 135-141
1509-4553
1899-8852
Pojawia się w:
Journal of Telecommunications and Information Technology
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Advanced compact modeling of the deep submicron technologies
Autorzy:
Grabiński, W.
Bucher, M.
Sallese, J.-M.
Krummenacher, F.
Powiązania:
https://bibliotekanauki.pl/articles/309312.pdf
Data publikacji:
2000
Wydawca:
Instytut Łączności - Państwowy Instytut Badawczy
Tematy:
ultra deep submicron (UDSM) technology
compact modeling
EKV MOS transistor model
MOSFET
matching
low power
RF applications
Opis:
The technology of CMOS large-scale integrated circuits (LSI's) achieved remarkable advances over last 25 year and the progress is expected to continue well into the next century. The progress has been driven by the downsizing of the active devices such as MOSFETs. Approaching these dimensions, MOSFET characteristics cannot be accurately predicted using classical modeling methods currently used in the most common MOSFET models such as BSIM, MM9 etc, without introducing large number of empirical parameters. Various physical effects that needed to be considered while modeling UDSM devices: quantization of the inversion layer, mobility degradation, carrier velocity saturation and overshoot, polydepletion effects, bias dependent source/drain resistances and capacitances, vertical and lateral doping profiles, etc. In this paper, we will discuss the progress in the CMOS technology and the anticipated difficulties of the sub-0.25 žm LSI downsizing. Subsequently, basic MOSFET modeling methodologies that are more appropriate for UDSM MOSFETs will be presented as well. The advances in compact MOSFET devices will be illustrated using application examples of the EPFL EKV model
Źródło:
Journal of Telecommunications and Information Technology; 2000, 3-4; 31-42
1509-4553
1899-8852
Pojawia się w:
Journal of Telecommunications and Information Technology
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

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