Wszystkie pola: SILAR - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Effect of Time Immersion of Thiourea on Structural and Optical Properties of CdS Deposited by SILAR
Autorzy:: Raid, A. Ismail
Nadir, F. Habubi
Kameran, Y. Qader
Powiązania:: https://bibliotekanauki.pl/articles/1178249.pdf
Data publikacji:: 2018
Wydawca:: Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:: CdS
Optical Properties
SILAR
Opis:: Successive ionic layer adsorption and reaction (SILAR) technique was used to prepare (CdS) thin films on glass substrate, by changing the immersion time in thiourea solution. XRD patterns proved that the as deposited thin films were polycrystalline structure with an average crystallite size ranging from 14.1 nm to 5.6 nm depending on immersion time. The EDX confirm the existence of CdS. Scanning electron microscopy reveals that the deposited films have a nanorod structure.Atomic force microscopy has shown that the values of average roughness and the root mean square roughness increase upon increasing the immersion time. The transmittance spectra reveal that as the immersion time increase, the value of transmittance decrease.
Źródło:: World Scientific News; 2018, 91; 73-85
2392-2192
Pojawia się w:: World Scientific News
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Characteristics of Ba-Doped PbS Thin Films Prepared by the SILAR Method
Autorzy:: Gülen, Y.
Powiązania:: https://bibliotekanauki.pl/articles/1205230.pdf
Data publikacji:: 2014-08
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.05.-a
61.05.cp
68.55.Ln
Opis:: In this material production research, undoped and Ba-doped nanostructured PbS films are fabricated on glass surfaces by SILAR method. The structural, optical and morphological properties of the films are examined via scanning electron microscopy, UV-vis spectrophotometry and X-ray diffraction analysis. Scanning electron microscopy analysis revealed that Ba-doping concentration influences the size of the thin film's nanoparticles. X-ray diffraction results showed that all of the thin films are in a face centered cubic structure. Optical studies, in the room temperature, revealed that the optical band gap of the films increases as Ba-doping concentration is increased. The intercept values on the energy axis in the range of 1.86 eV and 2.12 eV for 1% and 8% Ba-doped PbS films respectively. As a result, it is concluded that the structural, optical and morphological properties of the fabricated thin films are directly depend on the Ba doping ratio.
Źródło:: Acta Physica Polonica A; 2014, 126, 3; 763-767
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Deposition and Characterization of CdS, CuS and ZnS Thin Films Deposited by SILAR Method
Autorzy:: Guzeldir, B.
Saglam, M.
Ates, A.
Powiązania:: https://bibliotekanauki.pl/articles/1490738.pdf
Data publikacji:: 2012-01
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.05.-a
61.05.cp
61.72.uj
Opis:: Cadmium sulfide, copper sulfide and zinc sulfide films were grown on Si(111) substrate by successive ionic layer adsorption and reaction method at room temperature. The crystalline structure and morphology of obtained films were characterized by X-ray diffraction, scanning electronic microscope and energy dispersive X-ray analysis methods. The films were polycrystalline and showed preferred orientation. The surface morphology of these films looked relatively smooth and homogeneous in the scanning electron microscope image. The energy dispersive X-ray analysis spectra showed that the expected elements exist in the thin films.
Źródło:: Acta Physica Polonica A; 2012, 121, 1; 33-35
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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