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Wyświetlanie 1-3 z 3
Tytuł:
Contact Microscopy using a Compact Laser Produced Plasma Soft X-Ray Source
Autorzy:
Ayele, M.
Czwartos, J.
Adjei, D.
Wachulak, P.
Ahad, I.
Bartnik, A.
Wegrzynski, Ł.
Szczurek, M.
Jarocki, R.
Fiedorowicz, H.
Lekka, M.
Pogoda, K.
Gostek, J.
Powiązania:
https://bibliotekanauki.pl/articles/1398826.pdf
Data publikacji:
2016-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
52.50.Jm
68.37.Yz
85.40.Hp
Opis:
Soft X-ray contact microscopy potentially allows imaging of wet living biological specimens at a spatial resolution higher than optical microscopy and without many of the constraints of scanning electron microscopy. In this paper, we present the development of a laboratory scale contact microscope that uses a laser produced plasma soft X-ray source. The source is based on a double-stream gas-puff target approach and it operates in the "water window" spectral range which enables to capture images of biological samples with a natural contrast. In the preliminary experiments the contact microscope system has been used for imaging of fixed and dried non-malignant HCV29 human bladder cell lines cultured on polymethyl methacrylate photoresists. The samples were exposed with 150 pulses of soft X-rays as an initial test to demonstrate the possibility of image formation. The soft X-ray contact images registered in the photoresists exhibit high resolution in the atomic force microscopy topography which indicates the potential application of soft X-ray contact microscopy in life science to examine small features as small as few tens of nm. The technique could also be used for living cell imaging with further optimization of the microscope system and development of a special specimen holder. The details of the soft X-ray contact microscopy technique and the experimental results are presented and discussed.
Źródło:
Acta Physica Polonica A; 2016, 129, 2; 237-240
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Nanoimaging Using Soft X-Ray and EUV Sources Based on Double Stream Gas Puff Targets
Autorzy:
Wachulak, P.
Torrisi, A.
Ayele, M.
Bartnik, A.
Węgrzyński, Ł.
Fok, T.
Czwartos, J.
Fiedorowicz, H.
Powiązania:
https://bibliotekanauki.pl/articles/1030619.pdf
Data publikacji:
2018-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
gas puff target
Fresnel zone plates
EUV/SXR microscopy
contact microscopy
imaging
nanometer resolution
Opis:
In this work we present recent results on nanoscale imaging in the extreme ultraviolet and soft X-ray spectral ranges, describing three novel imaging systems dedicated for high spatial resolution imaging of nanoscale objects with the extreme ultraviolet and soft X-ray radiations. The extreme ultraviolet and soft X-ray full field microscopes operate at 13.8 nm and 2.88 nm wavelengths and are capable of imaging of nanostructures with a sub-50 nm spatial resolution. A soft X-ray contact microscope operates in the "water-window" spectral range from 2.3 to 4.4 nm wavelength, to obtain images of an internal structure of the investigated object in a thin surface layer of soft X-ray light sensitive photoresist. The development of such compact imaging systems may, in the near future, be important from the point of view of new research related to biological, material science, and nanotechnology applications. Such preliminary applications are also shown in the studies of biological samples, including carcinoma cells, diatoms, and neurons.
Źródło:
Acta Physica Polonica A; 2018, 133, 2; 271-276
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors
Autorzy:
Torrisi, A.
Wachulak, P.
Torrisi, L.
Bartnik, A.
Węgrzyński, Ł.
Fiedorowicz, H.
Powiązania:
https://bibliotekanauki.pl/articles/147432.pdf
Data publikacji:
2016
Wydawca:
Instytut Chemii i Techniki Jądrowej
Tematy:
gas-puff target
plasma diagnostic technique
SiC detector
‘water-window’
EUV
Opis:
An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ = 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterization.
Źródło:
Nukleonika; 2016, 61, 2; 139-143
0029-5922
1508-5791
Pojawia się w:
Nukleonika
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-3 z 3

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