- Tytuł:
- Structural, morphological and photoluminescent properties of annealed ZnO thin layers obtained by the rapid sol-gel spin-coating method
- Autorzy:
-
Sypniewska, Małgorzata
Szczesny, Robert
Popielarski, Paweł
Strzalkowski, Karol
Derkowska-Zielinska, Beata - Powiązania:
- https://bibliotekanauki.pl/articles/1818237.pdf
- Data publikacji:
- 2020
- Wydawca:
- Polska Akademia Nauk. Stowarzyszenie Elektryków Polskich
- Tematy:
-
FTIR and Raman spectroscopies
photoluminescence
SEM
XRD
ZnO thin films - Opis:
- ZnO thin layers were deposited on p-type silicon substrates by the sol-gel spin-coating method and, then, annealed at various temperatures in the range of 573-873 K. Photoluminescence was carried out in the temperature range of 20-300 K. All samples showed two dominant peaks that have UV emissions from 300 nm to 400 nm and visible emissions from 400 nm to 800 nm. Influence of temperature on morphology and chemical composition of fabricated thin layers was examined by XRD, SEM, FTIR, and Raman spectroscopy. These measurements indicate that ZnO structure is obtained for samples annealed at temperatures above 573 K. It means that below this temperature, the obtained thin films are not pure zinc oxide. Thus, annealing temperature significantly affected crystallinity of the thin films.
- Źródło:
-
Opto-Electronics Review; 2020, 28, 4; 182--190
1230-3402 - Pojawia się w:
- Opto-Electronics Review
- Dostawca treści:
- Biblioteka Nauki
Artykuł