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    Wyświetlanie 1-3 z 3
    Tytuł:
    Efficiency control of inverter fed induction motor drives
    Autorzy:
    Shaban, M. A.
    Powiązania:
    https://bibliotekanauki.pl/articles/376136.pdf
    Data publikacji:
    2012
    Wydawca:
    Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
    Tematy:
    induction motor
    torque-speed characteristic
    inverter
    Opis:
    Induction motor losses at partial loads can be significantly reduced by operating an adjustable frequency drive at the optimum slip which yields maximum efficiency. The present investigation quantifies the potential improvement in induction motor efficiency for both standard and energy efficient motors operating on a six-step voltage-source inverter supply. The analysis employs a comprehensive model of the induction motor which incorporates the frequency - dependent nature of the motor parameters and effects of stray load loss. Efficiency contours are plotted on a torque- speed plane for constant volts/hertz operation and for optimum slip frequency control plotted as a contour map.
    Źródło:
    Poznan University of Technology Academic Journals. Electrical Engineering; 2012, 72; 291-295
    1897-0737
    Pojawia się w:
    Poznan University of Technology Academic Journals. Electrical Engineering
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    An optimization model for reactive power control of super high voltage grid systems
    Autorzy:
    Shaban, M. A.
    Powiązania:
    https://bibliotekanauki.pl/articles/377699.pdf
    Data publikacji:
    2012
    Wydawca:
    Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
    Tematy:
    MVAR
    super high voltage grid systems
    power control
    voltage control
    reactive power
    Opis:
    This paper develops an optimization model to control the excessive (MVAR) generation by super high voltage gird systems for maintaining the nodal voltages within the required acceptable margin. The model enhances an approximate solution on the condition of balanced real power. The pseudo-inverse method of optimization is implemented as an optimal optimization is implemented as an optimal means of solving non-square systems of equations based on LaGrange's theory of optimization. It recommends the locations and ratings of the minimum required reactors from the preinstalled ones that to be in service for optimum nodal reactive power and voltage controls.
    Źródło:
    Poznan University of Technology Academic Journals. Electrical Engineering; 2012, 69; 89-93
    1897-0737
    Pojawia się w:
    Poznan University of Technology Academic Journals. Electrical Engineering
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Study of electro-thermal stress of IGBT devices
    Autorzy:
    Shaban, M. A.
    Ettomi, Y.
    Powiązania:
    https://bibliotekanauki.pl/articles/377956.pdf
    Data publikacji:
    2013
    Wydawca:
    Politechnika Poznańska. Wydawnictwo Politechniki Poznańskiej
    Tematy:
    electro-thermal stress
    IGBT
    Insulated Gate Bipolar Transistor
    Opis:
    The aim of this paper is to present a new approach which consists to correlate or coupled the functional and electrical stress with temperature. This approach can be extremely useful in the predicting the stressing effect and the impact of IXGH-IGBT I-V characteristics on circuit degradation. Moreover, this new approach significantly improves such parameters likes (threshold voltage Vth, collector saturation current, the stress and enhanced collector leakage current) and provides new capability for use this power device IXGH-IGBT in an actual circuit environment and modules. We also explain the physical reasons behind the improvement obtained using functional electrical stress on the IGBTs for IXYS constructor with temperature. Moreover, the forward blocking capability of IXGH-IGBT under a coupled Functional - Electro stress at high temperature was analyzed using simulation. This paper gives a straight comparison in term of the stress for improving the switching speed of IGBT device. This study is essential to ensure product reliability and to the evaluation of hot carrier reliability in the early stages. Furthermore, our reliability study permits us to improve the implantation of the device in a circuit, as well as its use in industrial operating conditions. The need for good simulator (Spice, Spice) to carry out a reliability study is pointed out in this paper.
    Źródło:
    Poznan University of Technology Academic Journals. Electrical Engineering; 2013, 76; 275-284
    1897-0737
    Pojawia się w:
    Poznan University of Technology Academic Journals. Electrical Engineering
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-3 z 3

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