- Tytuł:
- Photoelectron Emission Microscopy and its Application to the Study of Polymer Surfaces
- Autorzy:
-
Cossy-Favre, A.
Diaz, J.
Anders, S.
Padmore, H.
Liu, Y.
Samant, M.
Stöhr, J.
Brown, H.
Russell, T. P. - Powiązania:
- https://bibliotekanauki.pl/articles/1964108.pdf
- Data publikacji:
- 1997-05
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
61.16.Ms
73.61.Ph
64.75.+g - Opis:
- The X-ray photoelectron emission microscopy at the Advanced Light Source has a spatial resolution of 0.2 microns at an accelerating voltage of 12 kV. The tunability of the photon energy is used to provide chemical state information using near edge X-ray absorption fine structure spectroscopy on the sub-micrometer scale. The homogeneity of thin films of polymer blends was studied for various film thicknesses. The polystyrene/polyvinylmethylether film of 194 Å showed protrusions of 2-3 μm diameter with an enriched polystyrene content while the polystyrene/polystyreneacrylonitrile 504 Å thick films showed 5-6 μm segregated regions without any topological structure.
- Źródło:
-
Acta Physica Polonica A; 1997, 91, 5; 923-927
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł