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Wyszukujesz frazę "Lucinski, P." wg kryterium: Autor


Wyświetlanie 1-5 z 5
Tytuł:
Influence of the Deposition Temperature οn Magnetotransport Properties οf Ni-Fe/Au/Co/Au Multilayers
Autorzy:
Błaszyk, M.
Chomiuk, P.
Buchta, K.
Luciński, T.
Powiązania:
https://bibliotekanauki.pl/articles/1810589.pdf
Data publikacji:
2009-01
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
73.21.Ac
73.40.-c
75.47.De
75.70.-i
72.15.Gd
Opis:
A correlation between the growth process and electrical properties of $[Ni_{80}Fe_{20}(2 nm)//Au(2 nm)//Co(0.8 nm)//Au(2 nm)]_{15}$ multilayers is presented. A set of multilayers of identical composition was deposited in different temperatures. The changes in giant magnetoresistance amplitude were correlated with the changes in Co layers growth process that occur in different temperatures. The in situ conductance measurement leads to the growth mechanism identification in high temperatures as formation of Co islands. Intensified islandisation of Co was eventually confirmed by the temperature changes in shape of the Hall voltage loops, and the evolution of Co layers contribution.
Źródło:
Acta Physica Polonica A; 2009, 115, 1; 363-365
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Interface Mixing in Fe/Si Multilayers Observed by the In Situ Conductance Measurements
Autorzy:
Chomiuk, P.
Błaszyk, M.
Szymański, B.
Luciński, T.
Powiązania:
https://bibliotekanauki.pl/articles/1810582.pdf
Data publikacji:
2009-01
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
73.40.Sx
73.50.-h
Opis:
In this contribution the in situ conductance vs. deposition time dependences of Fe/Si multilayers are analysed. The plot of resistance multiplied by the square of the thickness as a function of iron thickness shows that during the iron deposition initially amorphous-like Fe-Si mixture is formed, next the mixture crystallises, and finally bcc-Fe phase appears. The interface mixing is also manifested by the reduction of the total multilayer thickness measured by small angle X-ray diffraction.
Źródło:
Acta Physica Polonica A; 2009, 115, 1; 355-356
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Electronic Transport Properties and Growth Mechanisms of Ni-Fe/Au/Co/Au Multilayers from In Situ Conduction Measurements
Autorzy:
Błaszyk, M.
Kempiński, M.
Buchta, K.
Chomiuk, P.
Luciński, T.
Powiązania:
https://bibliotekanauki.pl/articles/1534187.pdf
Data publikacji:
2010-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
73.50.-h
73.61.-r
75.70.Cn
72.15.-v
Opis:
In the following we present the role of surface scattering at Au/Co and Au/Ni-Fe interfaces in Ni-Fe/Au/Co/Au multilayers deposited in different temperatures. Specularity parameter, which describes the electron scattering, is calculated from fitting in situ collected conductance data with the Fuchs-Namba-Tesanovic model. Application of the parallel resistors model enabled to depict changes between Au/Co and Au/Ni-Fe interfaces within multilayers for each repetition. The correlation between enhanced grain boundary scattering for higher deposition temperatures and surface roughness of Ni-Fe/Au/Co/Au multilayers is found.
Źródło:
Acta Physica Polonica A; 2010, 118, 5; 861-863
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
In Situ Conductance of Fe/Si and Fe/Ge Multilayers
Autorzy:
Chomiuk, P.
Błaszyk, M.
Luciński, T.
Wróblewski, M.
Susła, B.
Powiązania:
https://bibliotekanauki.pl/articles/1813491.pdf
Data publikacji:
2008-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
73.40.Sx
73.50.-h
75.70.Cn
Opis:
In this paper we study Fe/Si and Fe/Ge multilayers prepared at room temperature by magnetron sputtering. In situ conductance measurements reveal the formation of interfacial Fe-Si and Fe-Ge mixtures. During the Fe deposition a modification of growth mode is noticed. Deposition of Si (or Ge) onto Fe leads to the reduction of the Fe layer thickness due to interdiffusion, and Fe-Si (or Fe-Ge) structures appear. Above about 1.3 nm of deposited Si (1.5 nm of Ge) nominally pure Si (Ge) starts growing. Surface topography of the Fe/Si multilayers is studied by atomic force microscopy.
Źródło:
Acta Physica Polonica A; 2008, 113, 2; 657-662
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Optical Studies of Non-Magnetic Spacer in Thin Fe/Si Multilayers
Autorzy:
Szuszkiewicz, W.
Jouanne, M.
Morhange, J.
Chernyshova, M.
Kowalczyk, L.
Łusakowska, E.
Wandziuk, P.
Luciński, T.
Powiązania:
https://bibliotekanauki.pl/articles/2044545.pdf
Data publikacji:
2005-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.55.-a
75.70.-i
78.30.-j
Opis:
Structures containing magnetic metallic layers attract a lot of attention because of their possible applications in the area of spintronics. The hybrid structures compatible with the Si crystal lattice parameter are of special interest. In this work the short-period Fe/Si multilayers were grown by the sputtering onto (001)-oriented Si substrate and investigated by various techniques. After the deposition, all multilayers were characterized by atomic force microscopy. The goal of the present paper was to determine the chemical composition of thin layer created at the interface in Fe/Si multilayers due to the Fe diffusion into Si, as well as to analyze the phenomena, which take place in this area. The results of the optical characterization by the Raman scattering were correlated with the magnetic properties of investigated structures (determined by means of the Kerr rotation).
Źródło:
Acta Physica Polonica A; 2005, 108, 5; 891-896
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-5 z 5

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