- Tytuł:
- On-wafer wideband characterization: a powerful tool for improving the IC technologies
- Autorzy:
-
Lederer, D.
Raskin, J. P. - Powiązania:
- https://bibliotekanauki.pl/articles/308775.pdf
- Data publikacji:
- 2007
- Wydawca:
- Instytut Łączności - Państwowy Instytut Badawczy
- Tematy:
-
silicon-on-insulator (SOI)
MOSFET
wideband characterization
microwave frequency
extraction techniques
small-signal equivalent circuit - Opis:
- In the present paper, the interest of wideband characterization for the development of integrated technologies is highlighted through several advanced devices, such as 120 nm partially depleted (PD) silicon-on-insulator (SOI) MOSFETs, 120 nm dynamic threshold (DT) voltage - SOI MOSFETs, 50 nm FinFETs as well as long-channel planar double gate (DG) MOSFETs.
- Źródło:
-
Journal of Telecommunications and Information Technology; 2007, 2; 69-77
1509-4553
1899-8852 - Pojawia się w:
- Journal of Telecommunications and Information Technology
- Dostawca treści:
- Biblioteka Nauki
Artykuł