- Tytuł:
- XAFS Studies of the Behaviour of Bi in Co/Cu Multilayers
- Autorzy:
-
Krupiński, M.
Kąc, M.
Polit, A.
Zabila, Y.
Zając, D.
Marszałek, M.
Kapusta, Cz.
Dobrowolska, A. - Powiązania:
- https://bibliotekanauki.pl/articles/1809826.pdf
- Data publikacji:
- 2009-02
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
61.05.cj
68.55.-a
68.65.Ac - Opis:
- The atomic environment of Bi atoms in the Co/Cu multilayered system was studied with X-ray absorption fine structure spectroscopy. Experiments were carried out on a Co(1 nm)/Cu(2 nm) system with 5 and 10 repetitions of Co/Cu evaporated with very low deposition rate in ultrahigh vacuum. A very small amount of Bi (0.06 nm) was deposited on each Cu film in the system. The X-ray absorption fine structure spectra were measured at the $BiL_3$ edge in the X-ray absorption near-edge structure and extended X-ray absorption fine structure ranges at the Beamline X1 of HASYLAB/DESY synchrotron laboratory in Hamburg. The experimental data showed different local neighbourhood of Bi, depending on the number of Co/Cu bilayer repetitions. The results are discussed in terms of the location and segregation of the Bi atoms as well as its possible oxidation ways.
- Źródło:
-
Acta Physica Polonica A; 2009, 115, 2; 565-567
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki