Autor: Nagao, M. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Quintet-gated FEA to form crossover beam
Autorzy:: Tagami, T.
Takeda, M.
Horie, S.
Yoshida, T.
Nagao, M.
Neo, Y.
Aoki, T.
Mimura, H.
Kanemaru, S.
Powiązania:: https://bibliotekanauki.pl/articles/385271.pdf
Data publikacji:: 2009
Wydawca:: Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
Tematy:: FEA
beam
Opis:: In this report, we have described about new field emission array (FEA) structure built-in micro-column. This newly proposed FEA has multi-gated structured and is designed to form a crossover. We had already demonstrated the quad- and quintet- gated FEA. A crossover formation by was successfully observed for the first time. by the quintetgated FEA Furthermore electron beam lithography was demonstrated.
Źródło:: Journal of Automation Mobile Robotics and Intelligent Systems; 2009, 3, 4; 157-158
1897-8649
2080-2145
Pojawia się w:: Journal of Automation Mobile Robotics and Intelligent Systems
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: ACdTe X-ray imaging device using vertical thin film field emitter array
Autorzy:: Tsunekawa, Y.
Nakagawa, N.
Neo, Y.
Morii, H.
Aokia, T.
Mimura, H.
Nagao, M.
Yoshidab, T.
Kanemaru, S.
Powiązania:: https://bibliotekanauki.pl/articles/385284.pdf
Data publikacji:: 2009
Wydawca:: Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
Tematy:: Vertical Thin Film Field Emitter Array
Schottky CdTe diode
ion induced bending
etch-back method
Opis:: We have demonstrated the novel CdTe X-ray imaging device that consists of a Schottky CdTe diode and a Vertical Thin Film Field Emitter Array (VTF-FEA). The Schottky CdTe diode was fabricated by deposied indium (In) thin film on a Cl-doped p-type (p-type) CdTe substrate and Sb2S3 on the opposite side of the CdTe substrate. VTF-FEA was fabricated by ion induced bending (IIB) and etch-back method. The signal current was successfully detected by the recombination of the stored on the surface holes with the emitted electrons from FEA, and it was clarified that it depended on the X-ray intensity. And the imaging device succeeded in obtaining the Cu plate transmission image.
Źródło:: Journal of Automation Mobile Robotics and Intelligent Systems; 2009, 3, 4; 137-139
1897-8649
2080-2145
Pojawia się w:: Journal of Automation Mobile Robotics and Intelligent Systems
Dostawca treści:: Biblioteka Nauki

Artykuł

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