- Tytuł:
- A comparison of various imaging modes in scanning electron microscopy during evaluation of selected Si/refractory sessile drop couples after wettability tests at ultra-high temperature
- Autorzy:
-
Polkowska, A.
Warmuzek, M.
Kalarus, J.
Polkowski, W.
Sobczak, N. - Powiązania:
- https://bibliotekanauki.pl/articles/391383.pdf
- Data publikacji:
- 2017
- Wydawca:
- Sieć Badawcza Łukasiewicz - Instytut Odlewnictwa
- Tematy:
-
scanning electron microscopy
sessile drop method
silicon
refractories
in-lens detectors - Opis:
- In this work, FEI SciosTM field emission gun scanning electron microscope (FEG SEM) equipped with a unique combination of analytical and imaging detectors was utilized to examine structure and chemistry of selected Si/ refractory couples. The couples were obtained in wettability tests performed by the sessile drop method coupled with contact heating of a refractory substrate (h-BN, SiC) at ultra-high temperature (up to 1750°C). The SEM observations were carried out on top-views of the couples, in order to evaluate surface and interfacial phenomena in Si/h-BN and Si/SiC systems. A full range of available detectors (e.g. classical Everhart-Thornley detector (ETD) or advanced in-lens detectors) working under various operation modes (secondary electrons (SE), backscattered electrons (BSE), a mixed mode), were used upon analyses in order to reveal specific features of obtained structures.
- Źródło:
-
Prace Instytutu Odlewnictwa; 2017, 57, 4; 337-344
1899-2439 - Pojawia się w:
- Prace Instytutu Odlewnictwa
- Dostawca treści:
- Biblioteka Nauki
Artykuł