- Tytuł:
- Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy
- Autorzy:
-
Neumann, W.
Kirmse, H.
Hausler, I.
Mogilatenko, A.
Zheng, C.
Hetaba, W. - Powiązania:
- https://bibliotekanauki.pl/articles/199872.pdf
- Data publikacji:
- 2010
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
electron microscopy
energy dispersive X-ray spectroscopy
electron energy loss spectroscopy
electron holography - Opis:
- Transmission electron microscopy (TEM) is a powerful diagnostic tool for the determination of structure/property relationships of materials. A comprehensive analysis of materials requires a combined use of a variety of complementary electron microscopical techniques of imaging, diffraction and spectroscopy at an atomic level of magnitude. The possibilities and limitations of quantitative TEM analysis will be demonstrated for interface studies of the following materials and materials systems: Nickel-based superalloy CMSX-10, (Zn,Cd)O/ZnO/Al2O3, (Al,Ga)N/AlN/Al2O3, GaN/LiAlO2 and FeCo-based nanocrystalline alloys.
- Źródło:
-
Bulletin of the Polish Academy of Sciences. Technical Sciences; 2010, 58, 2; 237-253
0239-7528 - Pojawia się w:
- Bulletin of the Polish Academy of Sciences. Technical Sciences
- Dostawca treści:
- Biblioteka Nauki
Artykuł