Autor: Piętka, B. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Fine Structure of Neutral Excitons in Single GaAlAs Quantum Dots
Autorzy:: Molas, M.
Gołasa, K.
Piętka, B.
Potemski, M.
Babiński, A.
Powiązania:: https://bibliotekanauki.pl/articles/1403612.pdf
Data publikacji:: 2012-12
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 78.55.Cr
78.67.Hc
Opis:: Optical anisotropy of neutral excitons in GaAlAs/AlAs quantum dots is investigated. Low-temperature polarization-sensitive photoluminescence measurements of single quantum dots are performed. It is found that neutral excitons (X) in the quantum dots exhibit a fine structure splitting. The fine structure splitting ranges from 10 μeV to 100 μeV and correlates with the X energy. The polarization axis of the fine structure splitting is well oriented along [110] crystallographic direction of a substrate. The orientation is attributed to the elongation of GaAlAs/AlAs quantum dots in the [110] direction of the substrate.
Źródło:: Acta Physica Polonica A; 2012, 122, 6; 988-990
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Confocal Microscope Studies of $MoS_{2}$ Layer Thickness
Autorzy:: Grzeszczyk, M.
Gołasa, K.
Piętka, B.
Babiński, A.
Szczytko, J.
Powiązania:: https://bibliotekanauki.pl/articles/1377207.pdf
Data publikacji:: 2014-11
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 78.20.Ci
63.20.dd
78.30.-j
78.66.Li
Opis:: We have been studying micro-luminescence of various exfoliated $MoS_{2}$ flakes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way - using atomic force microscopy, electron microscopy or the Raman spectroscopy - requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated flake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical reflectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of $MoS_{2}$ thickness.
Źródło:: Acta Physica Polonica A; 2014, 126, 5; 1207-1208
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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