- Tytuł:
- Electrical Characteristics of Tin Oxide Films Grown by Thermal Atomic Layer Deposition
- Autorzy:
-
Yoon, Seong Yu
Choi, Byung Joon - Powiązania:
- https://bibliotekanauki.pl/articles/352926.pdf
- Data publikacji:
- 2020
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
atomic layer deposition
tin oxide
electrical property
oxygen adsorption - Opis:
- Tin dioxide (SnO2 ) is an n-type semiconductor and has useful characteristics of high transmittance, excellent electrical properties, and chemical stability. Accordingly, it is widely used in a variety of fields, such as a gas sensor, photocatalyst, optoelectronics, and solar cell. In this study, SnO2 films are deposited by thermal atomic layer deposition (ALD) at 180°C using Tetrakis(dimethylamino)tin and water. A couple of 5.9, 7.4 and 10.1nm-thick SnO2 films are grown on SiO2 /Si substrate and then each film is annealed at 400°C in oxygen atmosphere. Current transport of SnO2 films are analyzed by measuring current – voltage characteristics from room temperature to 150°C. It is concluded that electrical property of SnO2 film is concurrently affected by its semiconducting nature and oxidative adsorption on the surface.
- Źródło:
-
Archives of Metallurgy and Materials; 2020, 65, 3; 1041-1044
1733-3490 - Pojawia się w:
- Archives of Metallurgy and Materials
- Dostawca treści:
- Biblioteka Nauki