- Tytuł:
- Hard X-ray Microscopy with Elemental, Chemical and Structural Contrast
- Autorzy:
-
Schroer, C.
Boye, P.
Feldkamp, J.
Patommel, J.
Schropp, A.
Samberg, D.
Stephan, S.
Burghammer, M.
Schöder, S.
Riekel, C.
Lengeler, B.
Falkenberg, G.
Wellenreuther, G.
Kuhlmann, M.
Frahm, R.
Lützenkirchen-Hecht, D.
Schroeder, W. - Powiązania:
- https://bibliotekanauki.pl/articles/1539040.pdf
- Data publikacji:
- 2010-02
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
68.37.Yz
41.40.th - Opis:
- We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given.
- Źródło:
-
Acta Physica Polonica A; 2010, 117, 2; 357-368
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł