- Tytuł:
- Automatic parametric fault detection in complex analog systems based on a method of minimum node selection
- Autorzy:
-
Bilski, A.
Wojciechowski, J. - Powiązania:
- https://bibliotekanauki.pl/articles/330761.pdf
- Data publikacji:
- 2016
- Wydawca:
- Uniwersytet Zielonogórski. Oficyna Wydawnicza
- Tematy:
-
complex analog system
support vector machine (SVM)
tabu search
genetic algorithm
parametric fault detection
system analogowy
maszyna wektorów wspierających
metoda tabu search
algorytm genetyczny
detekcja uszkodzeń - Opis:
- The aim of this paper is to introduce a strategy to find a minimal set of test nodes for diagnostics of complex analog systems with single parametric faults using the support vector machine (SVM) classifier as a fault locator. The results of diagnostics of a video amplifier and a low-pass filter using tabu search along with genetic algorithms (GAs) as node selectors in conjunction with the SVM fault classifier are presented. General principles of the diagnostic procedure are first introduced, and then the proposed approach is discussed in detail. Diagnostic results confirm the usefulness of the method and its computational requirements. Conclusions on its wider applicability are provided as well.
- Źródło:
-
International Journal of Applied Mathematics and Computer Science; 2016, 26, 3; 655-668
1641-876X
2083-8492 - Pojawia się w:
- International Journal of Applied Mathematics and Computer Science
- Dostawca treści:
- Biblioteka Nauki
Artykuł