- Tytuł:
- Effect of Annealing Temperature on the Electric and Dielectric Properties of $Se_{70}Te_{15}Bi_{15}$ Films
- Autorzy:
- Atyia, H.
- Powiązania:
- https://bibliotekanauki.pl/articles/1207359.pdf
- Data publikacji:
- 2014-01
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
72.80.Ng
77.22.-d - Opis:
- The effect of annealing at different temperatures between $T_{g}$ and $T_{c}$ on the AC conductivity and dielectric properties was studied for $Se_{70}Te_{15}Bi_{15}$ films grown by thermal evaporation technique. The films were characterized by X-ray diffraction, differential thermal analysis, and energy dispersive X-ray spectroscopy. X-ray diffraction analysis shows the occurrence of amorphous to polycrystalline transformation for films annealed at annealing temperature $T_{a}$≥ 473 K. AC conductivity $σ_{AC}(ω)$ was studied as a function of $T_{a}$, frequencies (0.1-100 kHz) and working temperatures (303-393 K). It was found that $σ_{AC}(ω)$ obeyed $Aω^{s}$ law. According to the values of s and its temperature dependence, the AC conduction mechanism was determined in terms of the correlated barrier hopping and quantum mechanical tunneling models for the as deposited and annealed films, respectively. The DC and AC activation energies were determined as a function of $T_{a}$. Values of dielectric constant $ε_1$ and dielectric loss $ε_2$ were found to increase with increasing $T_{a}$. A Debye-like relaxation of dielectric behavior was observed for polycrystalline films, and was found to be a thermally activated process.
- Źródło:
-
Acta Physica Polonica A; 2014, 125, 1; 98-104
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł