Autor: Matulionis, A. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: High-Frequency Noise Sources in Quantum Wells
Autorzy:: Ardaravičius, L.
Liberis, J.
Matulionis, A.
Powiązania:: https://bibliotekanauki.pl/articles/2035523.pdf
Data publikacji:: 2002-08
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 72.20.Ht
72.70.+m
73.40.Kp
Opis:: Hot-electron noise is investigated for InGaAs and InAs quantum wells containing a two-dimensional electron gas channel in a pulsed electric field applied parallel to the interfaces. Noise sources resulting from hot-electron "thermal" motion, electron temperature fluctuations, and real-space transfer are observed. The experimental results on hot-electron "thermal" noise are used to estimate energy relaxation time in the field range where other sources do not play any important role. Measurements of noise anisotropy in the plane of electron confinement are used to discuss real-space-transfer noise. High-frequency noise technique is used to study hot-electron trapping, and trap location in InAlAs/InGaAs/InAlAs heterostructure channels is determined.
Źródło:: Acta Physica Polonica A; 2002, 102, 2; 329-335
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Hot-Electron Transport and Microwave Noise in 4H-SiC
Autorzy:: Ardaravičius, L.
Liberis, J.
Kiprijanovič, O.
Matulionienė, I.
Matulionis, A.
Powiązania:: https://bibliotekanauki.pl/articles/2041761.pdf
Data publikacji:: 2005-02
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 72.20.Ht
72.70.+m
73.40.Kp
Opis:: Hot-electron transport and microwave noise are investigated for n-type 4H-SiC (n=2×10$\text{}^{17}$ cm$\text{}^{-3}$) subjected to a pulsed electric field applied parallel to the basal plane. At room temperature, the negative differential conductance, masked by field ionization at the highest fields, is observed in the field range between 280 and 350 kV/cm. The threshold fields for the negative differential conductance and field ionization increase with lattice temperature. The results on microwave noise are used to evaluate the effective hot-electron temperature and the hot-electron energy relaxation time.
Źródło:: Acta Physica Polonica A; 2005, 107, 2; 310-314
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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