- Tytuł:
- Noise and optical spectroscopy of single junction silicon solar cell
- Autorzy:
-
Skvarenina, L.
Macku, R. - Powiązania:
- https://bibliotekanauki.pl/articles/220371.pdf
- Data publikacji:
- 2018
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
non-destructive diagnostics
c-Si solar cells
1/f noise
electroluminescence
lock-in IR thermography - Opis:
- Noise spectroscopy as a highly sensitive method for non-destructive diagnostics of semiconductor devices was applied to solar cells based on crystalline silicon with a view to evaluating the quality and reliability of this solar cell type. The experimental approach was used in a reverse-biased condition where the internal structure of solar cells, as well as pn-junction itself, was electrically stressed and overloaded by a strong electric field. This gave rise to a strong generation of a current noise accompanied by local thermal instabilities, especially in the defect sites. It turned out that local temperature changes could be correlated with generation of flicker noise in a wide frequency range. Furthermore, an electrical breakdown in a non-stable form also occurred in some specific local regions what created micro-plasma noise with a two-level current fluctuation in the form of a Lorentzian-like noise spectrum. The noise research was carried out on both of these phenomena in combination with the spectrally-filtered electroluminescence mapping in the visible/near-infrared spectrum range and the dark lock-in infrared thermography in the far-infrared range. Then the physical origin of the light emission from particular defects was searched by a scanning electron microscope and additionally there was performed an experimental elimination of one specific defect by the focused ion beam milling.
- Źródło:
-
Metrology and Measurement Systems; 2018, 25, 2; 303-316
0860-8229 - Pojawia się w:
- Metrology and Measurement Systems
- Dostawca treści:
- Biblioteka Nauki
Artykuł