- Tytuł:
- Application of scanning shear-force microscope for fabrication of nanostructures
- Autorzy:
-
Sikora, A.
Gotszalk, T.
Sankowska, A.
Rangelow, I. W. - Powiązania:
- https://bibliotekanauki.pl/articles/308832.pdf
- Data publikacji:
- 2005
- Wydawca:
- Instytut Łączności - Państwowy Instytut Badawczy
- Tematy:
-
AFM
nanostructures fabrication
shear force microscopy - Opis:
- In view of the rapid growth of interest in AFM technique in surface property investigation and local surface modification we describe here an AFM microscope with optical tip oscillation detection. The modular shear-force/tunneling microscope for surface topography measurement and nanoanodisation is described. The measurement instrument presented here is based on the fiber Fabry-Perot interferometer for the measurement of the conductive microtip oscillation that is used as nano e-beam for local surface anodisation. An advantage of this system is that quantitative measurements of tip vibration amplitude are easily performed.
- Źródło:
-
Journal of Telecommunications and Information Technology; 2005, 1; 81-84
1509-4553
1899-8852 - Pojawia się w:
- Journal of Telecommunications and Information Technology
- Dostawca treści:
- Biblioteka Nauki
Artykuł