- Tytuł:
- Analysis of errors in on-wafer measurements due to multimode propagation in CB-CPW
- Autorzy:
-
Lewandowski, A.
Wiatr, W. - Powiązania:
- https://bibliotekanauki.pl/articles/307779.pdf
- Data publikacji:
- 2005
- Wydawca:
- Instytut Łączności - Państwowy Instytut Badawczy
- Tematy:
-
on-wafer measurements
multimode propagation
error analysis
conductor-backed coplanar waveguide (CB-CPW)
microstrip-like mode
numerical electromagnetic analysis
on-wafer probe
calibration
de-embedding
monolithic microwave integrated circuit (MMIC) - Opis:
- We study for the first time errors in on-wafer scattering parameter measurements caused by the parasitic microstrip-like mode propagation in conductor-backed coplanar waveguide (CB-CPW). We determine upper bound for these errors for typical CPW devices such as a matched load, an open circuit, and a transmission line section. To this end, we develop an electromagnetic-simulations-based multimode three-port model for the transition between an air-coplanar probe and the CB-CPW. Subsequently, we apply this model to examine errors in the device S parameters de-embedded from measurements affected by the parasitic MSL mode. Our analysis demonstrates that the multimode propagation in CB-CPW may significantly deteriorate the S-parameters measured on wafer.
- Źródło:
-
Journal of Telecommunications and Information Technology; 2005, 2; 16-22
1509-4553
1899-8852 - Pojawia się w:
- Journal of Telecommunications and Information Technology
- Dostawca treści:
- Biblioteka Nauki
Artykuł