- Tytuł:
- The problem of information leak due to parasitic loop currents and voltages in the KLJN secure key exchange scheme
- Autorzy:
-
Melhem, Mutaz Y.
Kish, Laszlo B. - Powiązania:
- https://bibliotekanauki.pl/articles/220471.pdf
- Data publikacji:
- 2019
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
unconditional security
key exchange
parasitic loop currents and voltages
information leak - Opis:
- The Kirchhoff-law-Johnson-noise (KLJN) secure key exchange scheme offers unconditional security, however it can approach the perfect security limit only in the case when the practical system’s parameters approach the ideal behavior of its core circuitry. In the case of non-ideal features, non-zero information leak is present. The study of such leaks is important for a proper design of practical KLJN systems and their privacy amplifications in order to eliminate these problems.
- Źródło:
-
Metrology and Measurement Systems; 2019, 26, 1; 37-40
0860-8229 - Pojawia się w:
- Metrology and Measurement Systems
- Dostawca treści:
- Biblioteka Nauki
Artykuł