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Wyszukujesz frazę "Shi, G." wg kryterium: Autor


Wyświetlanie 1-2 z 2
Tytuł:
A Fast Classification Method of Faults in Power Electronic Circuits Based on Support Vector Machines
Autorzy:
Cui, J.
Shi, G.
Gong, C.
Powiązania:
https://bibliotekanauki.pl/articles/220922.pdf
Data publikacji:
2017
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
power electronics
fault diagnosis
wavelet transforms
support vector machines
directed acyclic graph
nearest neighbours
Opis:
Fault detection and location are important and front-end tasks in assuring the reliability of power electronic circuits. In essence, both tasks can be considered as the classification problem. This paper presents a fast fault classification method for power electronic circuits by using the support vector machine (SVM) as a classifier and the wavelet transform as a feature extraction technique. Using one-against-rest SVM and one-against-one SVM are two general approaches to fault classification in power electronic circuits. However, these methods have a high computational complexity, therefore in this design we employ a directed acyclic graph (DAG) SVM to implement the fault classification. The DAG SVM is close to the one-against-one SVM regarding its classification performance, but it is much faster. Moreover, in the presented approach, the DAG SVM is improved by introducing the method of Knearest neighbours to reduce some computations, so that the classification time can be further reduced. A rectifier and an inverter are demonstrated to prove effectiveness of the presented design.
Źródło:
Metrology and Measurement Systems; 2017, 24, 4; 701-720
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
A key metric and its calculation models for a continuous diagnosis capability based on a dependency matrix
Autorzy:
Shi, J.-Y.
Lin, X.-G.
Shi, M.
Powiązania:
https://bibliotekanauki.pl/articles/221741.pdf
Data publikacji:
2012
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
fault diagnosis
dependency matrix
measurement
Opis:
This paper is devoted to measuring the continuous diagnosis capability of a system. A key metric and its calculation models are proposed enabling us to measure the continuous diagnosis capability of a system directly without establishing and searching the sequential fault tree (SFT) of the system. At first a description of a D matrix is given and its metric is defined to determine the weakness of a continuous diagnosis. Then based on the definition of a sequential fault combination, a sequential fault tree (SFT) is defined with its establishment process summarized. A key SFT metric is established to measure the continuous diagnosis capability of a system. Two basic types of dependency graphical models (DGMs) and one combination type of DGM are selected for characteristics analysis and establishment of metric calculation models. Finally, both the SFT searching method and direct calculation method are applied to two designs of one type of an auxiliary navigation equipment, which shows the high efficiency of the direct calculation method.
Źródło:
Metrology and Measurement Systems; 2012, 19, 3; 509-520
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-2 z 2

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