- Tytuł:
- Analysis of a Simple Method of CMOS IC Design for Yield Optimization
- Autorzy:
-
Tomaszewski, D.
Yakupov, M. - Powiązania:
- https://bibliotekanauki.pl/articles/397989.pdf
- Data publikacji:
- 2012
- Wydawca:
- Politechnika Łódzka. Wydział Mikroelektroniki i Informatyki
- Tematy:
-
CMOS
projektowanie pod kątem zysku
funkcja gęstości prawdopodobieństwa
dystrybuanta
modelowanie statystyczne
BPV
symulacja SPICE
design centering
design for yield
probability density function
cumulative distribution function
statistical modeling
BPV method
SPICE simulation - Opis:
- A simple approach for CMOS integrated circuit (IC) design taking into account a process variability and oriented towards optimization of a parametric yield has been presented. Its concept is based on cumulative distribution functions of random variables representing IC performances subject to process variations. In the method it has been assumed that CMOS process statistical data are expressed in terms of so-called process parameter distributions. Thus the design centering is done via layout parameter tuning. The approach relies on maximizing the probability that random variables corresponding to IC performances remain within the performance boundaries. Also, a methodology for statistical characterization of CMOS process has been briefly described. Finally, the method operation has been illustrated using analytical and SPICE models of CMOS inverter, operational amplifier and ring oscillator.
- Źródło:
-
International Journal of Microelectronics and Computer Science; 2012, 3, 3; 81-87
2080-8755
2353-9607 - Pojawia się w:
- International Journal of Microelectronics and Computer Science
- Dostawca treści:
- Biblioteka Nauki
Artykuł