- Tytuł:
- An XPS study of RF sputtered Ti1-x FexO2-delta thin films
- Autorzy:
-
Dumitru, L.
Apetrei, R.
Dobromir, M.
Dascaleanu, V.
Teodorescu, C M. - Powiązania:
- https://bibliotekanauki.pl/articles/384318.pdf
- Data publikacji:
- 2009
- Wydawca:
- Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
- Tematy:
-
Ti1-x FexO2-delta thin films
XPS
AFM
Fe2O3
hematite
magnetite - Opis:
- Introduction of small amounts of dopant Fe cations intitania was mainly intended for improving the oxidativepower of the host TiO2 surface, by shifting the absorption edge of the material towards the blue side of the visible range. Apart from this, other possible applications of Fe-containing TiO2 materials have been foreseen in the field of diluted ferromagnetic semiconductors for spintronics. As a general remark, while pristine and/or low-level doped titania materials remained a hot subject in basic research, and environment- and energy related applications, reports on Ti1-x FexO2 materials (x > 0.1) scarcely occurred in literature. We have initiated recently an investigation of heavily doped titania thin films within a wider iron compositionrange. Here, we report on the result of an XPS study of the RF sputtered oxygen-deficient thin films (x =0.15 - 0.62) and discuss the connection of the results with the macroscopic properties of the materials.
- Źródło:
-
Journal of Automation Mobile Robotics and Intelligent Systems; 2009, 3, 4; 15-17
1897-8649
2080-2145 - Pojawia się w:
- Journal of Automation Mobile Robotics and Intelligent Systems
- Dostawca treści:
- Biblioteka Nauki
Artykuł