- Tytuł:
- Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors
- Autorzy:
-
Torrisi, A.
Wachulak, P.
Torrisi, L.
Bartnik, A.
Węgrzyński, Ł.
Fiedorowicz, H. - Powiązania:
- https://bibliotekanauki.pl/articles/147432.pdf
- Data publikacji:
- 2016
- Wydawca:
- Instytut Chemii i Techniki Jądrowej
- Tematy:
-
gas-puff target
plasma diagnostic technique
SiC detector
‘water-window’
EUV - Opis:
- An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ = 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterization.
- Źródło:
-
Nukleonika; 2016, 61, 2; 139-143
0029-5922
1508-5791 - Pojawia się w:
- Nukleonika
- Dostawca treści:
- Biblioteka Nauki
Artykuł