- Tytuł:
- Nanoscale Pattern Definition by Edge Oxidation of Silicon under the $Si_{3}N_{4}$ mask - PaDEOx
- Autorzy:
-
Zaborowski, M.
Grabiec, P.
Dobrowolski, R.
Panas, A.
Skwara, K.
Szmigiel, D.
Wzorek, M. - Powiązania:
- https://bibliotekanauki.pl/articles/1807538.pdf
- Data publikacji:
- 2009-12
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
68.65.-k
74.78.-w
81.16.Nd
81.16.Rf
81.65.Cf - Opis:
- Well-controlled method of Si nanopattern definition - pattern definition by edge oxidation have been presented. The technique is suitable for fabrication of narrow paths of width ranged from several tens of nm to several μm by means of photolithography equipment working with μm-scale design rules. Process details influencing a shape of the Si pattern have been discussed. SEM examinations have been presented.
- Źródło:
-
Acta Physica Polonica A; 2009, 116, S; S-139-S-141
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł