Autor: Żukowski, O. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Influence of Annealing on the Electrical Properties οf Cz-Si Wafers Previously Subjected to the Hydrogen Ion-Beam Treatment
Autorzy:: Fedotov, A.
Korolik, O.
Mazanik, A.
Kołtunowicz, T.
Żukowski, P.
Powiązania:: https://bibliotekanauki.pl/articles/1503985.pdf
Data publikacji:: 2011-07
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.72.uf
81.40.Ef
Opis:: The main goal of this work is to establish the influence of annealing on the properties of Cz-Si wafers previously subjected to the hydrogen ion-beam treatment at 25 or 300-350°C. It is demonstrated by the conducted study that, despite similarity in the effects of the hydrogen ion-beam treatment at different temperatures on some electrical properties of the wafers (photovoltage spectra, thermoelectromotive force sign), thermal stability of changes in these properties due to the hydrogen ion-beam treatment depends on the hydrogenation temperature.
Źródło:: Acta Physica Polonica A; 2011, 120, 1; 108-110
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: Presence of Inductivity in $(CoFeZr)_x(PZT)_{1-x}$ Nanocomposite Produced by Ion Beam Sputtering
Autorzy:: Kołtunowicz, T.
Żukowski, P.
Boiko, O.
Fedotov, A.
Larkin, A.
Powiązania:: https://bibliotekanauki.pl/articles/1402211.pdf
Data publikacji:: 2015-11
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 62.23.Pq
79.20.Rf
81.40.Ef
72.80.Le
Opis:: This paper presents the investigations of the electrical properties of the $(CoFeZr)_{x}(PZT)_{1-x}$ nanocomposite with the metallic phase content x=43.8 at.%, which was produced by ion beam sputtering. Such preparation took place under an argon atmosphere with low oxygen content with its partial pressure $P_{O_2} = 2 \times 10^{-3} Pa$. The measurements were performed using alternating current within the frequency range of 50 Hz-10⁵ Hz for measuring temperatures ranging from 238 K to 328 K. The $(CoFeZr)_{43.8}(PZT)_{56.2}$ nanocomposite sample subjected to a 15 min annealing process in air at the temperature Tₐ=423 K demonstrates a phase angle of -90° ≤ θ ≤ 0° in the frequency range 50 Hz-10⁵ Hz. It corresponds to the capacitive type of conduction. In the frequency range 10⁴-10⁵ Hz sharp minima in selected conductivity vs. frequency characteristics occur, which corresponds to a current resonance phenomenon in RLC circuits. In case of a sample annealed at Tₐ=498 K the inductive type of conduction with 0° ≤ θ ≤ +90° occurs in a high frequency area. At the frequency $f_{r}$ characterized by the phase angle θ = 0°, the capacity value reaches its local minimum. It indicates a voltage resonance phenomenon in conventional RLC circuits. The θ = +90° crossing in the frequency dependence of phase angle corresponds to the current resonance phenomenon, which is represented by a strong local minimum in the conductivity vs. frequency characteristics.
Źródło:: Acta Physica Polonica A; 2015, 128, 5; 853-856
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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